FAULT DETECTION TEST SET FOR TESTABLE REALIZATIONS OF LOGIC FUNCTIONS WITH ESOP EXPRESSIONS

摘要

The circuit testable realization and its fault detection for logic functions with ESOP (EXOR-Sum-Of-Products) expressions are studied. First of all, for the testable realization by using XOR gate cascade, a test set with 2 n + m+ 1vectors for the detections of AND bridging faults and a test set with 2n + mvectors for the detections of OR bridging faults are presented. Secondly, for the testable realization by using XOR gate tree, a test set with 2n + mvectors for the detections of AND bridging faults and a test set with 3n + m+ 1vectors for the detections of OR bridging faults are presented. Finally, a single fault test set with n + 5vectors for the XOR gate tree realization is pre- sented. Where n is the number of input variables and m is the number of product terms in a logic function.