首页> 外国专利> LDMOS DEVICE WITH FIELD EFFECT STRUCTURE TO CONTROL BREAKDOWN VOLTAGE, AND METHODS OF MAKING SUCH A DEVICE

LDMOS DEVICE WITH FIELD EFFECT STRUCTURE TO CONTROL BREAKDOWN VOLTAGE, AND METHODS OF MAKING SUCH A DEVICE

机译:具有用于控制击穿电压的场效应结构的LDMOS器件及其制造方法

摘要

In one embodiment of an LDMOS device disclosed herein, the device includes a source region, a drain region and a gate electrode that are formed in and above a semiconducting substrate, wherein the gate electrode is generally laterally positioned between the source region and the drain region, a metal-1 field plate positioned above the gate electrode, and a silicide block layer that is positioned in an area between the gate electrode and the drain region. The device further includes at least one source contact that is conductively coupled to the metal-1 field plate and a conductive structure that is conductively coupled to the metal-1 field plate, wherein at least a first portion of the conductive structure extends downward toward the substrate in the area between the gate electrode and the drain region.
机译:在本文公开的LDMOS器件的一个实施例中,该器件包括形成在半导体衬底之中和之上的源极区域,漏极区域和栅极电极,其中栅极电极通常横向地位于源极区域和漏极区域之间。 ,位于栅电极上方的metal-1场板,以及位于栅电极和漏极区域之间的区域中的硅化物阻挡层。该装置还包括至少一个源极触点,该至少一个源极触点导电地耦合至金属1场板;以及导电结构,其导电耦合至金属1场板,其中该导电结构的至少第一部分朝着该金属极场板向下延伸。栅电极和漏区之间的区域中的衬底。

著录项

  • 公开/公告号US2013277741A1

    专利类型

  • 公开/公告日2013-10-24

    原文格式PDF

  • 申请/专利权人 ZHANG GUOWEI;PURAKH RAJ VERMA;

    申请/专利号US201213453222

  • 发明设计人 PURAKH RAJ VERMA;ZHANG GUOWEI;

    申请日2012-04-23

  • 分类号H01L29/78;

  • 国家 US

  • 入库时间 2022-08-21 16:52:03

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