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Device Feedback Sensor Testing Methodology For Humidity And Temperature Probes

机译:湿度和温度探头的设备反馈传感器测试方法

摘要

An embodiment of the present invention is an algorithmic method means for testing the performance characteristics of humidity and temperature probes i.e. accuracy, stability, repeatability of humidity and temperature sensor probes over a user selected dynamic range that is easily programmable by and end user. Further, said testing is accomplished and completed by using a specially designed humidity and temperature test chamber, that is traceable to NIST (National Institute of Science and Technology). Ongoing and final testing results are made visible for study by an end user via computer display and there is printout availability. Further, testing in said special chamber utilizes novel method means for probe attachment to said chamber and control thereof.
机译:本发明的一个实施例是一种算法方法,用于测试湿度和温度探头的性能特性,即在用户选择的动态范围内的湿度和温度传感器探头的精度,稳定性,可重复性,这很容易被最终用户编程。此外,所述测试是通过使用专门设计的湿度和温度测试室来完成和完成的,该测试室可追溯到NIST(美国国家科学技术研究院)。最终用户可以通过计算机显示屏看到正在进行的测试结果和最终测试结果,并且可以打印输出。此外,在所述特殊腔室中的测试利用新颖的方法将探针附接到所述腔室并对其进行控制。

著录项

  • 公开/公告号US2013138379A1

    专利类型

  • 公开/公告日2013-05-30

    原文格式PDF

  • 申请/专利权人 KAMAL SINGH MAHAJAN;

    申请/专利号US201113304502

  • 发明设计人 KAMAL SINGH MAHAJAN;

    申请日2011-11-25

  • 分类号G06F19/00;G01K15/00;

  • 国家 US

  • 入库时间 2022-08-21 16:48:18

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