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Device Feedback Sensor Testing Methodology For Humidity And Temperature Probes
Device Feedback Sensor Testing Methodology For Humidity And Temperature Probes
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机译:湿度和温度探头的设备反馈传感器测试方法
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摘要
An embodiment of the present invention is an algorithmic method means for testing the performance characteristics of humidity and temperature probes i.e. accuracy, stability, repeatability of humidity and temperature sensor probes over a user selected dynamic range that is easily programmable by and end user. Further, said testing is accomplished and completed by using a specially designed humidity and temperature test chamber, that is traceable to NIST (National Institute of Science and Technology). Ongoing and final testing results are made visible for study by an end user via computer display and there is printout availability. Further, testing in said special chamber utilizes novel method means for probe attachment to said chamber and control thereof.
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