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Device feedback sensor testing methodology for humidity and temperature probes
Device feedback sensor testing methodology for humidity and temperature probes
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机译:湿度和温度探头的设备反馈传感器测试方法
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摘要
An embodiment of the present invention is an algorithmic method for testing performance characteristics of humidity and temperature probes, i.e., accuracy, stability, and repeatability of humidity and temperature sensor probes over a user selected dynamic range, which is programmable by an end user. Further, the testing is accomplished and completed by using a specially designed humidity and temperature test chamber that is traceable to NIST (National Institute of Science and Technology). Ongoing, and final, testing results are made visible for study by the end user via a computer display, and there is printout availability. Further, testing in the chamber utilizes a method for probe attachment to the chamber and control thereof.
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