首页> 外国专利> Transistor structure with a sidewall-defined intrinsic base to extrinsic base link-up region and method of forming the transistor

Transistor structure with a sidewall-defined intrinsic base to extrinsic base link-up region and method of forming the transistor

机译:具有侧壁限定的本征基极至非本征基极连接区域的晶体管结构及其形成方法

摘要

Disclosed are embodiments of a bipolar or heterojunction bipolar transistor and a method of forming the transistor. The transistor can incorporate a dielectric layer sandwiched between an intrinsic base layer and a raised extrinsic base layer to reduce collector-base capacitance Ccb, a sidewall-defined conductive strap for an intrinsic base layer to extrinsic base layer link-up region to reduce base resistance Rb and a dielectric spacer between the extrinsic base layer and an emitter layer to reduce base-emitter Cbe capacitance. The method allows for self-aligning of the emitter to base regions and incorporates the use of a sacrificial dielectric layer, which must be thick enough to withstand etch and cleaning processes and still remain intact to function as an etch stop layer when the conductive strap is subsequently formed. A chemically enhanced high pressure, low temperature oxidation (HIPOX) process can be used to form such a sacrificial dielectric layer.
机译:公开了双极或异质结双极晶体管的实施例以及形成该晶体管的方法。晶体管可以包含介电层,该介电层夹在本征基极层和凸起的非本征基极层之间,以减小集电极-基极电容C cb ;侧壁定义的导电带,用于本征基极层与非本征基极层连接区以减小基极电阻R b ,并在非本征基极层和发射极层之间使用介电间隔层以减小基极-发射极C be电容。该方法可以使发射极与基极区域自对准,并采用牺牲介电层,该介电层必须足够厚以承受蚀刻和清洁工艺,并且在保持导电带时仍保持完整以用作蚀刻停止层随后形成。化学增强的高压,低温氧化(HIPOX)工艺可以用于形成这种牺牲介电层。

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