首页> 外国专利> Transmitter-only IC chip having external loopback test function and external loopback test method using the same

Transmitter-only IC chip having external loopback test function and external loopback test method using the same

机译:具有外部回送测试功能的仅发送器的IC芯片以及使用该芯片的外部回送测试方法

摘要

A transmitter-only integrated circuit (IC) chip for performing an external loopback test without an additional receive pin in a chip and an external loopback test method include drivers, mounted on the transmitter-only IC chip, for transmitting data through transmit pads that are installed in correspondence to a plurality of channels; and a loopback test circuit for receiving data as external loopback data through one of the transmit pads set as a receive pad for a test, the data being transmitted through one of the remaining transmit pads, and then comparing the received external loopback data with original transmit data.
机译:仅用于发送器的集成电路(IC)芯片,用于在芯片中没有附加接收引脚的情况下执行外部环回测试,并且一种外部环回测试方法包括安装在仅用于发送器的IC芯片上的驱动器,该驱动器用于通过发送垫来传输数据。对应于多个通道安装;环回测试电路,用于通过设置为测试的接收焊盘的发送焊盘之一接收数据作为外部环回数据,数据通过其余的发送焊盘之一进行发送,然后将接收到的外部环回数据与原始发送进行比较数据。

著录项

  • 公开/公告号US8559492B2

    专利类型

  • 公开/公告日2013-10-15

    原文格式PDF

  • 申请/专利权人 JONGSHIN SHIN;

    申请/专利号US20100895999

  • 发明设计人 JONGSHIN SHIN;

    申请日2010-10-01

  • 分类号H04B3/46;

  • 国家 US

  • 入库时间 2022-08-21 16:47:16

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