TRANSMITTER-DEDICATED IC CHIP HAVING EXTERNAL LOOPBACK TEST FUNCTION, AND EXTERNAL LOOPBACK TEST METHOD USING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a transmitter-dedicated integrated circuit (IC) chip capable of performing an external loopback test without an additional receive pin.;SOLUTION: The transmitter-dedicated integrated circuit chip 200 includes: drivers for transmitting data through transmit pads that are installed in response to a plurality of channels; and a loopback test circuit 100, in the transmitter-dedicated chip, for receiving data as external loopback data through one of the transmission pads set as a receive pad for a test, the data being transmitted through one of the remaining transmit pads, and then comparing the received external loopback data with original transmission data. An aspect of this invention is capable of performing the external loopback test inexpensively even with the transmitter-dedicated integrated circuit chip.;COPYRIGHT: (C)2011,JPO&INPIT