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IEEE International Test Conference

召开年：2016
召开地：Fort Worth(US)
出版时间：-

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1.Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors

机译：处理错误的映射：使用低销回旋压缩机进行更好诊断的新方向
- 作者：Subhadip Kundu;Parthajit Bhattacharya;Rohit Kapur
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Compressors;
- Convolution;
- Synthetic aperture sonar;
- Fault diagnosis;
- Compaction;
- Pins;
2.Using symbolic canceling to improve diagnosis from compacted response

机译：使用符号消除来改善紧凑响应带来的诊断
- 作者：Kamran Saleem;Nur A. Touba
- 会议名称：《IEEE International Test Conference》 | 2016年
- Fault location;
- Data mining;
- Compaction;
- Mathematical model;
- Logic gates;
- Production;
- Shift registers;
3.Minimal area test points for deterministic patterns

机译：确定性图案的最小面积测试点
- 作者：Yingdi Liu;Elham Moghaddam;Nilanjan Mukherjee;Sudhakar M. Reddy;Janusz Rajski;Jerzy Tyszer
- 会议名称：《IEEE International Test Conference》 | 2016年
- Flip-flops;
- Measurement;
- Logic gates;
- Circuit faults;
- Silicon;
- Automatic test pattern generation;
- Signal resolution;
4.SERDES external loopback test using production parametric-test hardware

机译：使用生产参数测试硬件进行SERDES外部环回测试
- 作者：Shalini Arora;Aman Aflaki;Sounil Biswas;Masashi Shimanouchi
- 会议名称：《IEEE International Test Conference》 | 2016年
- Production;
- Insertion loss;
- Resistors;
- Microstrip;
- Pins;
- Bit error rate;
5.Fault simulation for analog test coverage

机译：故障模拟以进行模拟测试
- 作者：Jyotsna Sequeira;Suriyaprakash Natarajan;Prashant Goteti;Nitin Chaudhary
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Manufacturing;
- Integrated circuit modeling;
- Analog circuits;
- Silicon;
- Load modeling;
- Transmitters;
6.A built-in self-repair scheme for DRAMs with spare rows, columns, and bits

机译：具有备用行，列和位的DRAM的内置自修复方案
- 作者：Chih-Sheng Hou;Yong-Xiao Chen;Jin-Fu Li;Chih-Yen Lo;Ding-Ming Kwai;Yung-Fa Chou
- 会议名称：《IEEE International Test Conference》 | 2016年
- Random access memory;
- Maintenance engineering;
- Circuit faults;
- Redundancy;
- Registers;
- Algorithm design and analysis;
- Decoding;
7.Mixed-signal ATE technology and its impact on today's electronic system

机译：混合信号ATE技术及其对当今电子系统的影响
- 作者：Gordon W. Roberts
- 会议名称：《IEEE International Test Conference》 | 2016年
- Manufacturing;
- Semiconductor device measurement;
- Integrated circuits;
- Engines;
- Digital signal processing;
- Computer architecture;
8.Novel crosstalk evaluation method for high-density signal traces using clock waveform conversion technique

机译：利用时钟波形转换技术的高密度信号线串扰评估方法
- 作者：Takayuki Nakamura;Koji Asami
- 会议名称：《IEEE International Test Conference》 | 2016年
9.Defect tolerance for CNFET-based SRAMs

机译：基于CNFET的SRAM的缺陷容限
- 作者：Tianjian Li;Li Jiang;Xiaoyao Liang;Qiang Xu;Krishnendu Chakrabarty
- 会议名称：《IEEE International Test Conference》 | 2016年
- CNTFETs;
- Redundancy;
- Maintenance engineering;
- Circuit faults;
- Computer architecture;
- SRAM cells;
10.Accessing 1687 systems using arbitrary protocols

机译：使用任意协议访问1687系统
- 作者：Michele Portolan
- 会议名称：《IEEE International Test Conference》 | 2016年
- Protocols;
- Registers;
- Standards;
- Ports (Computers);
- Instruments;
- Artificial intelligence;
- Finite element analysis;
11.A unified test and fault-tolerant multicast solution for network-on-chip designs

机译：片上网络设计的统一测试和容错多播解决方案
- 作者：Dong Xiang;Krishnendu Chakrabarty;Hideo Fujiwara
- 会议名称：《IEEE International Test Conference》 | 2016年
- Fault tolerance;
- Fault tolerant systems;
- Unicast;
- Routing;
- Built-in self-test;
- System-on-chip;
12.Analog fault coverage improvement using final-test dynamic part average testing

机译：使用最终测试动态零件平均值测试来改善模拟故障覆盖率
- 作者：Wim Dobbelaere;Ronny Vanhooren;Willy De Man;Koen Matthijs;Anthony Coyette;Baris Esen;Georges Gielen
- 会议名称：《IEEE International Test Conference》 | 2016年
- Testing;
- Circuit faults;
- Vehicle dynamics;
- Probes;
- Integrated circuits;
- Industries;
13.Effective DC fault models and testing approach for open defects in analog circuits

机译：有效的直流故障模型和测试方法，用于模拟电路中的开路缺陷
- 作者：Baris Esen;Anthony Coyette;Georges Gielen;Wim Dobbelaere;Ronny Vanhooren
- 会议名称：《IEEE International Test Conference》 | 2016年
- Transistors;
- Semiconductor process modeling;
- Circuit faults;
- Capacitance;
- Logic gates;
- Analog circuits;
- Metals;
14.Low cost ultra-pure sine wave generation with self calibration

机译：具有自校准功能的低成本超纯正弦波生成
- 作者：Yuming Zhuang;Akhilesh Kesavan Unnithan;Arun Joseph;Siva Sudani;Benjamin Magstadt;Degang Chen
- 会议名称：《IEEE International Test Conference》 | 2016年
- Power harmonic filters;
- Matched filters;
- Harmonic analysis;
- Filtering algorithms;
- Distortion;
- Calibration;
- Testing;
15.Supply-voltage optimization to account for process variations in high-volume manufacturing testing

机译：优化电源电压以解决大批量制造测试中的工艺变化
- 作者：Gurunath Kadam;Markus Rudack;Krishnendu Chakrabarty;Juergen Alt
- 会议名称：《IEEE International Test Conference》 | 2016年
- Semiconductor device modeling;
- SPICE;
- Testing;
- Mathematical model;
- Performance evaluation;
- Foundries;
16.Pylon: Towards an integrated customizable volume diagnosis infrastructure

机译：Pylon：建立集成的可定制体积诊断基础结构
- 作者：Yan Pan;Rao Desineni;Kannan Sekar;Atul Chittora;Sherwin Fernandes;Neerja Bawaskar;John Carulli
- 会议名称：《IEEE International Test Conference》 | 2016年
- Poles and towers;
- Databases;
- Engines;
- Automation;
- Foundries;
- Inspection;
- Systematics;
17.DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems

机译：DE-LOC：在有限的观察和控制下，混合信号系统的硅前后，进行设计验证和调试
- 作者：Barry Muldrey;Sabyasachi Deyati;Abhijit Chatterjee
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Computer bugs;
- Silicon;
- Training;
- Debugging;
- Algorithm design and analysis;
- Predictive models;
18.EMACS: Efficient MBIST architecture for test and characterization of STT-MRAM arrays

机译：EMACS：高效的MBIST架构，用于测试和表征STT-MRAM阵列
- 作者：Insik Yoon;Ashwin Chintaluri;Arijit Raychowdhury
- 会议名称：《IEEE International Test Conference》 | 2016年
- Magnetic tunneling;
- Couplings;
- Computer architecture;
- Saturation magnetization;
- Magnetic resonance imaging;
- Circuit faults;
- Thermal stability;
19.A novel diagnostic test generation methodology and its application in production failure isolation

机译：一种新颖的诊断测试生成方法及其在生产故障隔离中的应用
- 作者：M. Enamul Amyeen;Dongok Kim;Maheshwar Chandrasekar;Mohammad Noman;Srikanth Venkataraman;Anurag Jain;Neha Goel;Ramesh Sharma
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Silicon;
- Microprocessors;
- Industries;
- Manufacturing processes;
- Complexity theory;
20.Accurate anomaly detection using correlation-based time-series analysis in a core router system

机译：在核心路由器系统中使用基于相关性的时间序列分析进行准确的异常检测
- 作者：Shi Jin;Zhaobo Zhang;Krishnendu Chakrabarty;Xinli Gu
- 会议名称：《IEEE International Test Conference》 | 2016年
- Fault tolerance;
- Fault tolerant systems;
- Detectors;
- Feature extraction;
- Training;
- Monitoring;
- Communication systems;
21.Statistical outlier screening as a test solution health monitor

机译：统计离群值筛选作为测试解决方案健康监控程序
- 作者：David Shaw;Dirk Hoops;Kenneth M. Butler;Amit Nahar
- 会议名称：《IEEE International Test Conference》 | 2016年
- Monitoring;
- Hardware;
- Algorithm design and analysis;
- Probes;
- Standards;
- Sociology;
- Statistics;
22.Upper-bound computation for optimal retargeting in IEEE1687 networks

机译：IEEE1687网络中用于最佳重定向的上限计算
- 作者：Farrokh Ghani Zadegan;René Krenz-Baath;Erik Larsson
- 会议名称：《IEEE International Test Conference》 | 2016年
- Instruments;
- Registers;
- System-on-chip;
- Clocks;
- Electronic mail;
- Computational modeling;
- Discrete Fourier transforms;
23.Diagnostic resolution improvement through learning-guided physical failure analysis

机译：通过学习指导的物理故障分析提高诊断分辨率
- 作者：Carlston Lim;Yang Xue;Xin Li;Ronald D. Blanton;M. Enamul Amyeen
- 会议名称：《IEEE International Test Conference》 | 2016年
- Training data;
- Training;
- Support vector machines;
- Sociology;
- Statistics;
- Failure analysis;
- Electronic mail;
24.A suite of IEEE 1687 benchmark networks

机译：一套IEEE 1687基准网络
- 作者：Anton Tšertov;Artur Jutman;Sergei Devadze;Matteo Sonza Reorda;Erik Larsson;Farrokh Ghani Zadegan;Riccardo Cantoro;Mehrdad Montazeri;Rene Krenz-Baath
- 会议名称：《IEEE International Test Conference》 | 2016年
- Benchmark testing;
- Instruments;
- Standards;
- Registers;
- Ports (Computers);
- Multiplexing;
- Monitoring;
25.Test point insertion in hybrid test compression/LBIST architectures

机译：混合测试压缩/ LBIST体系结构中的测试点插入
- 作者：Elham Moghaddam;Nilanjan Mukherjee;Janusz Rajski;Jerzy Tyszer;Justyna Zawada
- 会议名称：《IEEE International Test Conference》 | 2016年
- Logic gates;
- Circuit faults;
- Built-in self-test;
- System-on-chip;
- Silicon;
- Automotive engineering;
- Discrete Fourier transforms;
26.Cross-layer system reliability assessment framework for hardware faults

机译：硬件故障的跨层系统可靠性评估框架
- 作者：A. Vallero;A. Savino;G. Politano;S. Di Carlo;A. Chatzidimitriou;S. Tselonis;M. Kaliorakis;D. Gizopoulos;M. Riera;R. Canal;A. Gonzalez;M. Kooli;A. Bosio;G. Di Natale
- 会议名称：《IEEE International Test Conference》 | 2016年
- Computational modeling;
- Hardware;
- Software reliability;
- Bayes methods;
- Estimation;
- Software;
27.Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture

机译：使用浪费的时钟周期：通过扫描移位捕获增强偶然的单元感知故障检测
- 作者：Fanchen Zhang;Daphne Hwong;Yi Sun;Allison Garcia;Soha Alhelaly;Geoff Shofner;LeRoy Winemberg;Jennifer Dworak
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Clocks;
- Standards;
- Flip-flops;
- System-on-chip;
- Fault detection;
- Compaction;
28.Output bit selection methodology for test response compaction

机译：输出位选择方法，用于测试响应压缩
- 作者：Wei-Cheng Lien;Kuen-Jong Lee
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Compaction;
- Radiation detectors;
- Computer architecture;
- Benchmark testing;
- Algorithm design and analysis;
- System-on-chip;
29.An accurate algorithm for computing mutation coverage in model checking

机译：在模型检查中计算变异覆盖率的精确算法
- 作者：Huina Chao;Huawei Li;Tiancheng Wang;Xiaowei Li;Bo Liu
- 会议名称：《IEEE International Test Conference》 | 2016年
30.An on-chip self-test architecture with test patterns recorded in scan chains

机译：片上自测架构，测试模式记录在扫描链中
- 作者：Kuen-Jong Lee;Pin-Hao Tang;Michael A. Kochte
- 会议名称：《IEEE International Test Conference》 | 2016年
- Silicon;
- System-on-chip;
- Built-in self-test;
- Compaction;
- Circuit faults;
- Computer architecture;
31.Memory repair for high fault rates

机译：内存修复，故障率高
- 作者：Panagiota Papavramidou
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Maintenance engineering;
- Error correction codes;
- Integrated circuit reliability;
- Fabrication;
- Memory management;
32.Testing of interposer-based 2.5D integrated circuits

机译：测试基于中介层的2.5D集成电路
- 作者：Ran Wang;Krishnendu Chakrabarty
- 会议名称：《IEEE International Test Conference》 | 2016年
- Through-silicon vias;
- Silicon;
- Standards;
- Built-in self-test;
- Metals;
33.Transformation of multiple fault models to a unified model for ATPG efficiency enhancement

机译：将多个故障模型转换为统一模型以提高ATPG效率
- 作者：Cheng-Hung Wu;Kuen-Jong Lee
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Integrated circuit modeling;
- Logic gates;
- Transforms;
- Wires;
- Compaction;
- Solid modeling;
34.Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis

机译：使用电路划分和间隔分析为混合信号集成电路自动生成测试信号
- 作者：Anthony Coyette;Baris Esen;Wim Dobbelaere;Ronny Vanhooren;Georges Gielen
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Computational modeling;
- Integrated circuit modeling;
- Complexity theory;
- Digital circuits;
- Testing;
35.Variation and failure characterization through pattern classification of test data from multiple test stages

机译：通过来自多个测试阶段的测试数据的模式分类来进行变化和故障表征
- 作者：Chun-Kai Hsu;Peter Sarson;Gregor Schatzberger;Friedrich Leisenberger;John Carulli;Siddhartha Siddhartha;Kwang-Ting Cheng
- 会议名称：《IEEE International Test Conference》 | 2016年
- Correlation;
- Production;
- Semiconductor device modeling;
- Systematics;
- Semiconductor device measurement;
- Data models;
- Discrete cosine transforms;
36.Built-in self-test for micro-electrode-dot-array digital microfluidic biochips

机译：内置微电极点阵列数字微流控生物芯片自检
- 作者：Zipeng Li;Kelvin Yi-Tse Lai;Po-Hsien Yu;Krishnendu Chakrabarty;Tsung-Yi Ho;Chen-Yi Lee
- 会议名称：《IEEE International Test Conference》 | 2016年
- Built-in self-test;
- Microelectrodes;
- Sensors;
- Computer architecture;
- Transistors;
- Circuit faults;
37.Logic characterization vehicle design reflection via layout rewiring

机译：通过布局布线逻辑反映车辆设计
- 作者：Phillip Fynan;Zeye Liu;Benjamin Niewenhuis;Soumya Mittal;Marcin Strajwas;R. D. Shawn Blanton
- 会议名称：《IEEE International Test Conference》 | 2016年
- Layout;
- Product design;
- Standards;
- Vehicles;
- Random access memory;
- Benchmark testing;
- Fabrication;
38.Recycled FPGA detection using exhaustive LUT path delay characterization

机译：使用详尽的LUT路径延迟表征进行回收的FPGA检测
- 作者：Md Mahbub Alam;Mark Tehranipoor;Domenic Forte
- 会议名称：《IEEE International Test Conference》 | 2016年
- Field programmable gate arrays;
- Table lookup;
- Aging;
- Logic gates;
- Transistors;
- Delays;
39.Machine learning-based defense against process-aware attacks on Industrial Control Systems

机译：基于机器学习的防御，可防御工业控制系统上的过程感知攻击
- 作者：Anastasis Keliris;Hossein Salehghaffari;Brian Cairl;Prashanth Krishnamurthy;Michail Maniatakos;Farshad Khorrami
- 会议名称：《IEEE International Test Conference》 | 2016年
- Integrated circuits;
- Process control;
- Security;
- Mathematical model;
- Real-time systems;
- Hardware;
- Software;
40.Advanced test methodology for complex SoCs

机译：复杂SoC的高级测试方法
- 作者：Pavan Kumar Datla Jagannadha;Mahmut Yilmaz;Milind Sonawane;Sailendra Chadalavada;Shantanu Sarangi;Bonita Bhaskaran;Ayub Abdollahian
- 会议名称：《IEEE International Test Conference》 | 2016年
- IP networks;
- Pins;
- Testing;
- Codecs;
- Discrete Fourier transforms;
- Clocks;
- Silicon;
41.I-Q signal generation techniques for communication IC testing and ATE systems

机译：用于通信IC测试和ATE系统的I-Q信号生成技术
- 作者：Masahiro Murakami;Haruo Kobayashi;Shaiful Nizam Bin Mohyar;Osamu Kobayashi;Takahiro Miki;Junya Kojima
- 会议名称：《IEEE International Test Conference》 | 2016年
- Modulation;
- Testing;
- Integrated circuits;
- Band-pass filters;
- Noise shaping;
- Quantization (signal);
- Digital signal processing;
42.Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states

机译：使用映射预测检查状态的非线性控制系统中的有效跨层并发错误检测
- 作者：Suvadeep Banerjee;Abhijit Chatterjee;Jacob A. Abraham
- 会议名称：《IEEE International Test Conference》 | 2016年
- Fault detection;
- Robot sensing systems;
- Actuators;
- Nonlinear systems;
- Fault tolerance;
- Fault tolerant systems;
43.BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning

机译：BIST-RM：使用片上时钟扫描和机器学习的BIST辅助的SoC可靠性管理
- 作者：Mehdi Sadi;Gustavo Contreras;Dat Tran;Jifeng Chen;LeRoy Winemberg;Mark Tehranipoor
- 会议名称：《IEEE International Test Conference》 | 2016年
- Aging;
- Degradation;
- Clocks;
- Mathematical model;
- Delays;
- Instruction sets;
44.RF test accuracy and capacity enhancement on ATE for silicon TV tuners

机译：用于硅电视调谐器的ATE的RF测试精度和容量增强
- 作者：Y. Fan;A. Verma;Y. Su;L. Rose;J. Janney;V. Do;S. Kumar
- 会议名称：《IEEE International Test Conference》 | 2016年
- Radio frequency;
- Tuners;
- TV;
- Silicon;
- Noise measurement;
- Gain;
- Production;
45.A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded BIST datapath

机译：具有嵌入式BIST数据路径的异构内核的可重构内置内存自我修复架构
- 作者：V. R. Devanathan;Sumant Kale
- 会议名称：《IEEE International Test Conference》 | 2016年
- Maintenance engineering;
- Built-in self-test;
- Fuses;
- Registers;
- Memory management;
- IP networks;
46.Test time efficient group delay filter characterization technique using a discrete chirped excitation signal

机译：使用离散chi激励信号测试时间有效的群时延滤波器表征技术
- 作者：Peter Sarson
- 会议名称：《IEEE International Test Conference》 | 2016年
- Delays;
- Chirp;
- Time-frequency analysis;
- Phased arrays;
- Digital signal processing;
- Phase measurement;
47.Automated measurement of defect tolerance in mixed-signal ICs

机译：自动化测量混合信号IC中的缺陷容限
- 作者：Stephen Sunter;Alessandro Valerio;Riccardo Miglierina
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- Monitoring;
- Integrated circuits;
- Measurement;
- Redundancy;
48.Harnessing process variations for optimizing wafer-level probe-test flow

机译：利用工艺变化来优化晶圆级探针测试流程
- 作者：Ali Ahmadi;Constantinos Xanthopoulos;Amit Nahar;Bob Orr;Michael Pas;Yiorgos Makris
- 会议名称：《IEEE International Test Conference》 | 2016年
- Probes;
- Data mining;
- Engines;
- Optimization;
- Automatic test equipment;
49.What we know after twelve years developing and deploying test data analytics solutions

机译：经过十二年的开发和部署测试数据分析解决方案，我们所知道的
- 作者：Kenneth M. Butler;Amit Nahar;W. Robert Daasch
- 会议名称：《IEEE International Test Conference》 | 2016年
- Manufacturing;
- Mathematical model;
- Semiconductor device measurement;
- Production;
- Data models;
- Semiconductor device modeling;
- Testing;
50.Online slack-time binning for IO-registered die-to-die interconnects

机译：IO注册的管芯到管芯互连的在线空闲时间合并
- 作者：Chih-Chieh Zheng;Shi-Yu Huang;Shyue-Kung Lu;Ting-Chi Wang;Kun-Han Tsai;Wu-Tung Cheng
- 会议名称：《IEEE International Test Conference》 | 2016年
- Monitoring;
- Delays;
- Integrated circuit interconnections;
- Clocks;
- Flip-flops;
- Tuning;
51.Test chip design for optimal cell-aware diagnosability

机译：测试芯片设计可实现最佳的细胞感知诊断能力
- 作者：Soumya Mittal;Zeye Liu;Ben Niewenhuis;R. D. Shawn Blanton
- 会议名称：《IEEE International Test Conference》 | 2016年
- Circuit faults;
- IP networks;
- Logic gates;
- Standards;
- Libraries;
- Integrated circuit modeling;
- Benchmark testing;
52.Securing digital microfluidic biochips by randomizing checkpoints

机译：通过随机化检查点来保护数字微流控生物芯片
- 作者：Jack Tang;Ramesh Karri;Mohamed Ibrahim;Krishnendu Chakrabarty
- 会议名称：《IEEE International Test Conference》 | 2016年
- Electrodes;
- Hardware;
- Cameras;
- Security;
- Trojan horses;
- Charge coupled devices;
53.Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board

机译：电源阻抗仿真可消除由于ATE和客户板之间的阻抗差异而造成的过大杀伤
- 作者：Toru Nakura;Naoki Terao;Masahiro Ishida;Rimon Ikeno;Takashi Kusaka;Tetsuya Iizuka;Kunihiro Asada
- 会议名称：《IEEE International Test Conference》 | 2016年
- Power supplies;
- Impedance;
- Voltage measurement;
- Testing;
- Mathematical model;
- Voltage control;
- Impedance measurement;
54.Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors

机译：主动可靠性监视器：在22nm POWER8和zSeries处理器上的缺陷级别外部可靠性监视
- 作者：Michael Johnson;Brian Noble;Mark Johnson;Jim Crafts;Cynthia Manya;John Deforge
- 会议名称：《IEEE International Test Conference》 | 2016年
- Maintenance engineering;
- Monitoring;
- Semiconductor device reliability;
- Production;
- Stress;
- Arrays;
55.Known-good-die test methods for large, thin, high-power digital devices

机译：适用于大型，薄型，高功率数字设备的良好管芯测试方法
- 作者：Dave Armstrong;Gary Maier
- 会议名称：《IEEE International Test Conference》 | 2016年
- Testing;
- Probes;
- Three-dimensional displays;
- Mathematical model;
- Thermal resistance;
- Electrical resistance measurement;
- Performance evaluation;