首页> 外国专利> Method for fabricating a damascene self-aligned ferroelectric random access memory (F-RAM) having a ferroelectric capacitor aligned with a three dimensional transistor structure

Method for fabricating a damascene self-aligned ferroelectric random access memory (F-RAM) having a ferroelectric capacitor aligned with a three dimensional transistor structure

机译:具有与三维晶体管结构对准的铁电电容器的镶嵌自对准铁电随机存取存储器(F-RAM)的制造方法

摘要

Disclosed is a non-volatile, ferroelectric random access memory (F-RAM) device and a method for fabricating a damascene self-aligned F-RAM that allows for the formation of a ferroelectric capacitor with separated PZT layers aligned with a preexisting, three dimensional (3-D) transistor structure.
机译:公开了一种非易失性铁电随机存取存储器(F-RAM)设备和制造镶嵌自对准F-RAM的方法,该方法允许形成铁电电容器,该铁电电容器具有与预先存在的三维对准的分离的PZT层。 (3-D)晶体管结构。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号