首页> 外国专利> Miniaturized all-reflective holographic fourier transform imaging spectrometer based on a new all-reflective interferometer

Miniaturized all-reflective holographic fourier transform imaging spectrometer based on a new all-reflective interferometer

机译:基于新型全反射干涉仪的小型化全反射全​​息傅里叶变换成像光谱仪

摘要

A miniaturized Holographic Fourier transform imaging spectrometer HFTIS, made from simple all-reflective components and with no moving parts, is provided. This HFTIS includes an all-reflective two beam interferometer, which provides two interfering beams; a two-dimensional detector array to detect the interference pattern created by the beams; a computing machine for correcting the distortions in the pattern and calculating the spectrum from the corrected interferogram. The same principle can be used to build spot spectrometers, line-scan imaging spectrometers (also called array spectrometers or line-scan hyperspectral cameras) as well as two-dimensional instantaneous imaging spectrometers (also called staring hyperspectral cameras). In all variants of HFTIS that can be built using this invention, the wave-signal collecting element can also be built of all-reflective components. Digital correction can be utilized to straighten the interference fringes and to compensate for the impact of used lenses and other refractive components, to produce correct spectra after Fourier Transformation.
机译:提供了一种由简单的全反射组件制成且没有移动部件的小型全息傅里叶变换成像光谱仪HFTIS。该HFTIS包括一个全反射两光束干涉仪,它提供两个干涉光束。二维检测器阵列,检测由光束产生的干涉图样;用于校正图案中的畸变并从校正后的干涉图计算光谱的计算机器。可以使用相同的原理来构建点光谱仪,线扫描成像光谱仪(也称为阵列光谱仪或线扫描高光谱相机)以及二维瞬时成像光谱仪(也称为凝视高光谱相机)。在可以使用本发明构建的HFTIS的所有变型中,波信号收集元件也可以由全反射组件构建。可以利用数字校正来拉直干涉条纹,并补偿用过的透镜和其他折射组件的影响,在傅立叶变换后产生正确的光谱。

著录项

  • 公开/公告号US8446458B2

    专利类型

  • 公开/公告日2013-05-21

    原文格式PDF

  • 申请/专利权人 HAMED HAMID MUHAMMED;

    申请/专利号US20080744690

  • 发明设计人 HAMED HAMID MUHAMMED;

    申请日2008-12-01

  • 分类号G01J3/26;G01J3/45;G01J3/40;

  • 国家 US

  • 入库时间 2022-08-21 16:45:20

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