首页> 外国专利> Nonvolatile semiconductor memory including multi-threshold voltage memory cells including voltage ranges indicating either an erase state or a two or more program state

Nonvolatile semiconductor memory including multi-threshold voltage memory cells including voltage ranges indicating either an erase state or a two or more program state

机译:包括多阈值电压存储单元的非易失性半导体存储器,该多阈值电压存储单元包括指示擦除状态或两个或多个编程状态的电压范围

摘要

In a nonvolatile semiconductor memory device wherein a plurality of threshold voltages are set so as to store multi-valued information in one memory cell, data is first written into the memory cell whose threshold voltage is the lowest as a written state from the erase level, and data is successively written into memory cells whose threshold voltages are higher.
机译:在其中设置多个阈值电压以便在一个存储单元中存储多值信息的非易失性半导体存储器件中,首先将数据写入到阈值电压最低的存储单元中,该存储单元的阈值电压是从擦除电平起最低的写入状态;数据被依次写入阈值电压较高的存储单元。

著录项

  • 公开/公告号USRE44350E

    专利类型

  • 公开/公告日2013-07-09

    原文格式PDF

  • 申请/专利权人 KEIICHI YOSHIDA;SHOOJI KUBONO;

    申请/专利号US20100794905

  • 发明设计人 KEIICHI YOSHIDA;SHOOJI KUBONO;

    申请日2010-06-07

  • 分类号G11C11/34;G11C16/04;

  • 国家 US

  • 入库时间 2022-08-21 16:43:18

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