首页> 外国专利> OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER TRANSFORM SPECTROSCOPIC ANALYSIS APPARATUS

OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER TRANSFORM SPECTROSCOPIC ANALYSIS APPARATUS

机译:光学半导体封装,MICHELSON干涉仪和傅里叶变换光谱分析仪

摘要

An optical semiconductor package is provided with an optical semiconductor element, a temperature detection unit, and a temperature control unit (46) comprising a support member (46S). The optical semiconductor element and the temperature detection unit are disposed such that the temperature of a portion (P44) of the surface of the support member (46S) where the optical semiconductor element is disposed, and the temperature of a portion (P45) of the surface of the support member (46S) where the temperature detection unit is disposed are in a relationship wherein both the temperatures are approximately thermally balanced with each other.
机译:光半导体封装件包括光半导体元件,温度检测单元和包括支撑构件(46S)的温度控制单元(46)。布置光学半导体元件和温度检测单元,使得支撑构件(46S)的布置有光学半导体元件的表面的部分(P44)的温度和支撑构件(46S)的部分(P45)的温度。设置有温度检测单元的支撑构件(46S)的表面处于这样的关系,其中两个温度彼此大致热平衡。

著录项

  • 公开/公告号WO2013084746A1

    专利类型

  • 公开/公告日2013-06-13

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA INC.;HIRAO YUSUKE;

    申请/专利号WO2012JP80557

  • 发明设计人 HIRAO YUSUKE;

    申请日2012-11-27

  • 分类号H01S5/022;G01J3/10;G01J3/45;H01S5/024;H01S5/183;

  • 国家 WO

  • 入库时间 2022-08-21 16:32:35

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