首页> 外国专利> OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER TRANSFORM SPECTROSCOPIC ANALYSIS APPARATUS

OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER TRANSFORM SPECTROSCOPIC ANALYSIS APPARATUS

机译:光学半导体封装,米歇尔干涉仪和傅里叶变换光谱分析仪

摘要

An optical semiconductor package includes an optical semiconductor device, a temperature detection unit, and a temperature control unit (46) including a support member (46S), the optical semiconductor device and the temperature detection unit being arranged such that a temperature of a portion (P44) of a surface of the support member (46S) where the optical semiconductor device is arranged and a temperature of a portion (P45) of the surface of the support member (46S) where the temperature detection unit is arranged are substantially in thermal equilibrium with each other.
机译:光半导体封装件包括光半导体器件,温度检测单元和包括支撑构件(46S)的温度控制单元(46),该光半导体器件和温度检测单元布置成使得部分(布置有光半导体器件的支撑构件(46S)的表面的P44)和布置有温度检测单元的支撑构件(46S)的表面的一部分(P45)的温度基本处于热平衡。彼此。

著录项

  • 公开/公告号EP2793329A4

    专利类型

  • 公开/公告日2015-09-02

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA INC.;

    申请/专利号EP20120856468

  • 发明设计人 HIRAO YUSUKE;

    申请日2012-11-27

  • 分类号H01S5/068;G01B9/02;G01J3/10;G01J3/45;G01J5/06;H01S5/022;H01S5/024;H01S5/183;

  • 国家 EP

  • 入库时间 2022-08-21 15:05:13

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