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SEMICONDUCTOR DEVICE AND AN OPERATING METHOD THEREOF CAPABLE OF SHORTENING TIME OF AN EVALUATION SECTION IN A VERIFICATION OPERATION
SEMICONDUCTOR DEVICE AND AN OPERATING METHOD THEREOF CAPABLE OF SHORTENING TIME OF AN EVALUATION SECTION IN A VERIFICATION OPERATION
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机译:验证操作中能够缩短评估部分时间的半导体装置及其操作方法
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摘要
PURPOSE: A semiconductor device and an operating method thereof are provided to reduce operation time by continuously verifying memory cells with various levels in a verification operation of a multi level cell.;CONSTITUTION: Bit lines corresponding to selected memory cells are precharged. A first verification voltage is applied to a word line(Sel. WL) connected to the selected memory cells. The potential of the bit lines in which the states of the selected memory cells is reflected for the first time(EV1) is sensed. A first target voltage(PV1) higher than a first verification voltage is applied to the word line. The states of the selected memory cells are reflected in the bit lines for the second time(EV2) which is shorter than the first time.;COPYRIGHT KIPO 2013;[Reference numerals] (AA,BB) Level rise; (CC) Precharge; (DD,FF,II,KK,NN) Evaluation; (EE,GG,JJ,LL,OO) Sensing; (HH,MM) Level rise
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