首页> 外国专利> SEMICONDUCTOR DEVICE AND AN OPERATING METHOD THEREOF CAPABLE OF SHORTENING TIME OF AN EVALUATION SECTION IN A VERIFICATION OPERATION

SEMICONDUCTOR DEVICE AND AN OPERATING METHOD THEREOF CAPABLE OF SHORTENING TIME OF AN EVALUATION SECTION IN A VERIFICATION OPERATION

机译:验证操作中能够缩短评估部分时间的半导体装置及其操作方法

摘要

PURPOSE: A semiconductor device and an operating method thereof are provided to reduce operation time by continuously verifying memory cells with various levels in a verification operation of a multi level cell.;CONSTITUTION: Bit lines corresponding to selected memory cells are precharged. A first verification voltage is applied to a word line(Sel. WL) connected to the selected memory cells. The potential of the bit lines in which the states of the selected memory cells is reflected for the first time(EV1) is sensed. A first target voltage(PV1) higher than a first verification voltage is applied to the word line. The states of the selected memory cells are reflected in the bit lines for the second time(EV2) which is shorter than the first time.;COPYRIGHT KIPO 2013;[Reference numerals] (AA,BB) Level rise; (CC) Precharge; (DD,FF,II,KK,NN) Evaluation; (EE,GG,JJ,LL,OO) Sensing; (HH,MM) Level rise
机译:目的:提供一种半导体器件及其操作方法,以通过在多级单元的验证操作中连续验证具有各种级别的存储单元来减少操​​作时间。组成:与所选存储单元相对应的位线被预充电。将第一验证电压施加到连接到所选存储单元的字线(Sel.WL)。感测其中被选择的存储单元的状态被第一次反映的位线的电位(EV1)。高于第一验证电压的第一目标电压(PV1)被施加到字线。 COPYRIGHT KIPO 2013; [参考数字](AA,BB)电平上升;第二步(EV2)反映了所选存储单元的状态,该状态比第一次短。 (CC)预充电; (DD,FF,II,KK,NN)评估; (EE,GG,JJ,LL,OO)感应; (HH,MM)液位上升

著录项

  • 公开/公告号KR20120127930A

    专利类型

  • 公开/公告日2012-11-26

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20110045721

  • 发明设计人 YANG CHANG WON;

    申请日2011-05-16

  • 分类号G11C16/34;G11C16/06;

  • 国家 KR

  • 入库时间 2022-08-21 16:28:40

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