首页> 外国专利> NON-CONSTRUCTIVE INSPECTING DEVICE FOR A LIGHT EMITTING ELEMENT, CAPABLE OF MAINTAINING THE CONSISTENCY OF MEASUREMENT BY COMPARING THE AMOUNT OF LEAKED LIGHTS

NON-CONSTRUCTIVE INSPECTING DEVICE FOR A LIGHT EMITTING ELEMENT, CAPABLE OF MAINTAINING THE CONSISTENCY OF MEASUREMENT BY COMPARING THE AMOUNT OF LEAKED LIGHTS

机译:发光元件的非结构性检查装置,能够通过比较射出的光量来保持测量的一致性

摘要

PURPOSE: A non-constructive inspecting device for a light emitting element is provided to reduce the time for testing an adhesive property between a body and a lead frame of the light emitting element and to measure the adhesive property without damaging the light emitting element.;CONSTITUTION: A non-constructive inspecting device for a light emitting element comprises a light emitting element unit(41), one or more light source units(11,21,31), and a sensing-and-detecting unit(51). A plurality of the light emitting elements with a body and a lead frame is arrayed on the light emitting element unit. The light source units correspond to the lead frames of the light emitting elements. The sensing-and-detecting unit is arranged in a direction opposite to the lead frames of the light emitting units, thereby detecting lights leaked out from the light emitting elements.;COPYRIGHT KIPO 2013;[Reference numerals] (23,13,33) First light source; (25,15,35) Second light source
机译:目的:提供一种用于发光元件的非结构性检查装置,以减少测试发光元件的主体与引线框架之间的粘附性的时间,并在不损坏发光元件的情况下测量粘附性。构成:一种用于发光元件的非结构性检查装置,包括发光元件单元(41),一个或多个光源单元(11、21、31)以及感测单元(51)。具有主体和引线框架的多个发光元件排列在发光元件单元上。光源单元对应于发光元件的引线框架。感测检测单元布置在与发光单元的引线框相反的方向上,从而检测从发光元件泄漏的光。; COPYRIGHT KIPO 2013; [附图标记](23、13、33)第一光源; (25,15,35)第二光源

著录项

  • 公开/公告号KR20130021295A

    专利类型

  • 公开/公告日2013-03-05

    原文格式PDF

  • 申请/专利权人 LG INNOTEK CO. LTD.;

    申请/专利号KR20110083718

  • 发明设计人 KIM TAE JIN;

    申请日2011-08-22

  • 分类号G01N21/88;G01M11/08;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:37

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