首页> 外国专利> METHOD FOR DEPOSITING A HIGHLY CONFORMAL AMORPHOUS CARBON FILM ON RAISED FEATURES CAPABLE OF IMPROVING A MATCHING PROPERTY OF A DEPOSITED AMORPHOUS CARBON FILM

METHOD FOR DEPOSITING A HIGHLY CONFORMAL AMORPHOUS CARBON FILM ON RAISED FEATURES CAPABLE OF IMPROVING A MATCHING PROPERTY OF A DEPOSITED AMORPHOUS CARBON FILM

机译:在可改善沉积非晶碳膜的匹配性能的凸起特征上沉积高度共形的非晶碳膜的方法

摘要

PURPOSE: A method for depositing a highly conformal amorphous carbon film on raised features is provided to improve a film deposition rate on the side of a substrate by preventing a crack of an amorphous carbon film in the bottom of a sidewall of the substrate using process gas pressure over 1 Torr.;CONSTITUTION: A raised feature with a peak(105) and a sidewall(103) and a substrate with a field surface(107) are formed on a substrate holder in a process chamber. Process gas with hydrocarbon gas, oxygen containing gas, and argon or helium is inputted to the process chamber. Process gas pressure over 1 Torr is maintained in the process chamber. Plasma is generated from the process gas by using a microwave plasma source. A conformal amorphous carbon film(108) is deposited on the surface of the raised feature by exposing the substrate to the plasma.;COPYRIGHT KIPO 2013
机译:目的:提供一种用于在凸起特征上沉积高度共形的非晶碳膜的方法,以通过使用工艺气体防止非晶碳膜在基板侧壁底部的破裂来提高基板侧面的成膜速率。压力超过1托;组成:在处理腔室中的基板支架上形成带有峰(105)和侧壁(103)的凸起特征以及带有电场表面(107)的基板。将具有碳氢化合物气体,含氧气体以及氩气或氦气的处理气体输入到处理室中。处理室中的处理气体压力保持在1托以上。通过使用微波等离子体源,从工艺气体中产生等离子体。通过将基板暴露于等离子体,在凸起特征的表面上沉积共形的无定形碳膜(108)。COPYRIGHTKIPO 2013

著录项

  • 公开/公告号KR20130022378A

    专利类型

  • 公开/公告日2013-03-06

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号KR20120091781

  • 发明设计人 TAKABA HIROYUKI;

    申请日2012-08-22

  • 分类号H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:38

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