首页> 外国专利> SEMICONDUCTOR DEVICE HAVING A TRENCH ISOLATION LAYER CAPABLE OF PREVENTING FILLING FAILURE AND A METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR DEVICE HAVING A TRENCH ISOLATION LAYER CAPABLE OF PREVENTING FILLING FAILURE AND A METHOD FOR FABRICATING THE SAME

机译:具有能够防止填充故障的沟槽隔离层的半导体器件及其制造方法

摘要

PURPOSE: A semiconductor device having a trench isolation layer and a method for fabricating the same are provided to minimize the generation of a stress due to a post thermal process without using a spin-on insulating layer or a floating insulation layer.;CONSTITUTION: A substrate (110) has a trench (130). A liner insulation layer (151) covers the lower and lateral surfaces of the trench. The sidewall of the liner insulation layer has an even thickness from a first depth (D1) to the bottom surface. A micro trench (152) and the lower part of the trench are filled with a first element isolation insulation layer (153). A trench on the first element isolation insulation layer is filled with a second element isolation insulation layer (155).;COPYRIGHT KIPO 2013
机译:目的:提供一种具有沟槽隔离层的半导体器件及其制造方法,以在不使用旋涂绝缘层或浮动绝缘层的情况下,最大程度地减少由于后热处理而产生的应力。衬底(110)具有沟槽(130)。衬里绝缘层(151)覆盖沟槽的下表面和侧面。衬垫绝缘层的侧壁从第一深度(D1)到底表面具有均匀的厚度。微沟槽(152)和沟槽的下部填充有第一元件隔离绝缘层(153)。第一元件隔离绝缘层上的沟槽填充有第二元件隔离绝缘层(155)。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130087929A

    专利类型

  • 公开/公告日2013-08-07

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20120009197

  • 发明设计人 KIM TAI HO;

    申请日2012-01-30

  • 分类号H01L21/76;

  • 国家 KR

  • 入库时间 2022-08-21 16:26:32

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