Method for non-destructive quantitative determination of micro-voltage II. And / or III. kind

摘要

The present invention relates to methods for the non-destructive quantitative determination of the micro-tensions II. And / or III. Type based on subtraction of the maximum values of the load voltage dependence of the maximum Barkhausen noise amplitudes on a test specimen before and after removal of the specimen into specific thermal aging states. The present invention thus enables the independent determination of the micro-voltage II or III. Kind simultaneous and resolved determination of microperfection II. And III. Type, as well as the determination of the sum of the two types of micro-tensions.