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Method for non-destructive quantitative determination of micro-voltage II. And / or III. kind
Method for non-destructive quantitative determination of micro-voltage II. And / or III. kind
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机译:微电压无损定量测定方法II。和/或III。类
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摘要
Method for non-destructive quantitative determination of micro-voltage III. Type (coherence residual strain III type, σKoh.III) and II. Type (thermally induced residual stress II. Type, σtherm.II) and / or the sum of the micro-tensions II. And III. Type (Δσ = σtherm.II + σKoh.III) of an Fe and Cu-containing alloy system with a Cu content of ≤ 2 wt .-% comprising the following steps: a) Determining the load voltage value σ1, in which the load voltage dependence of the maximum Barkhausen noise amplitude MMAX (σ) for a test specimen from the alloy system in an initial state, having a maximum, b) first swapping of the test specimen to the exclusive formation of coherent Cu precipitates, c) determination of the load voltage value σ2, at which the load voltage dependence of the maximum Barkhausen noise amplitude MMAX (σ) for a specimen after the first aging and cooling has a maximum d) further removal of the specimen to the Ostwald ripening, e) determination of the load voltage value σ3, in which the load voltage dependence of the maximum Barkhausen noise amplitude MMAX (σ) for a test specimen after the further outsourcing to the Ostwald ripening and cooling a maxi m), f) determination of the microequality II. type (σtherm.II) as difference σtherm.II = | σ1 - σ3 | g) Determination of micro-voltage III. Kind by i. Forming the sum of micro-voltage II. Type and micro-voltage III. Type as difference Δσ = σtherm.II + σKoh.III = | σ1 - σ2 | and subsequent difference formation σKoh.III = | Δσ - σtherm.II | or ii. as difference σKoh.III = | σ3 - σ2 |.
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