Method for parameterization of voltage measuring device for detecting voltage at medium- or high voltage systems, involves determining capacitance value of primary capacitance of predetermined medium- or high voltage system

摘要

The method involves determining a capacitance value of a primary capacitance (5) of a predetermined medium- or high voltage system by installing a primary capacitance measuring voltage with a predetermined voltage value at a capacitive voltage divider. A measurement of short circuit current is carried out for short circuiting a secondary capacitance (6). The actual value of a rated operating voltage of the medium- or high voltage system is determined by the measurement of short circuit current. The voltage measurement is carried out at secondary voltage by the capacitance measuring device. An independent claim is included for a voltage measuring device for voltage detection at medium- or high voltage systems by voltage measurement at a secondary capacitance of a capacitive voltage divider.