首页> 外文期刊>Japanese journal of applied physics >Effect Of Fullerene Concentration On Flat-band Voltage Shiftof Capacitance-voltage Curve In Organic Memory Devices Fabricatedrnusing Hybrid Poly(4-vinyl Phenol) Active Layer Containing Fullerene
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Effect Of Fullerene Concentration On Flat-band Voltage Shiftof Capacitance-voltage Curve In Organic Memory Devices Fabricatedrnusing Hybrid Poly(4-vinyl Phenol) Active Layer Containing Fullerene

机译:富勒烯浓度对含有富勒烯的混合聚(4-乙烯基苯酚)有源层制造的有机存储器件中电容电压曲线的平带电压位移的影响

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摘要

Organic memory devices based on a hybrid poly(4-vinyl phenol) (PVP) layer containing fullerene (C_(60)) were formed by a spin coating method. Atomic force microscopy (AFM) images showed that the surface of the PVP layer containing C_(60) was uniform. Capacitance-voltage (C-V) measurements on Al/C_(60) embedded in PVP layer/p-Si(100) devices at room temperature showed a hysteresis" with a large flat-band voltage shift due to the existence of C_(60)) molecules, indicative of the charge storage in the C_(60) molecules. The magnitude of the flat-band voltage shift for the memory devices with a hybrid active layer consisting of PVP and C_(60) increased with increasing C_(60) concentration.
机译:通过旋涂法形成了基于含有富勒烯(C_(60))的杂化聚(4-乙烯基苯酚)(PVP)层的有机存储设备。原子力显微镜(AFM)图像显示,含有C_(60)的PVP层表面均匀。在室温下,对嵌入PVP层/ p-Si(100)器件中的Al / C_(60)的电容-电压(CV)测量显示出“滞后”现象,由于存在C_(60),导致大的平带电压漂移)分子,表示C_(60)分子中的电荷存储。具有由PVP和C_(60)组成的混合有源层的存储器件的平带电压偏移幅度随C_(60)浓度的增加而增加。

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