首页> 外国专利> NITRIDE-BASED SEMICONDUCTOR EPITAXIAL WAFER AND NITRIDE-BASED FIELD-EFFECT TRANSISTOR

NITRIDE-BASED SEMICONDUCTOR EPITAXIAL WAFER AND NITRIDE-BASED FIELD-EFFECT TRANSISTOR

机译:基于氮化物的半导体外延片和基于氮化物的场效应晶体管

摘要

PROBLEM TO BE SOLVED: To suppress occurrence of current collapse.;SOLUTION: A nitride-based semiconductor epitaxial wafer comprises: a substrate; a nucleation layer formed on the substrate and composed of aluminum nitride; a buffer layer formed on the nucleation layer and composed of gallium nitride; and a barrier layer formed on the buffer layer and composed of aluminum gallium nitride. The total concentration of silicon concentration and oxygen concentration in the barrier layer is higher than carbon concentration in the barrier layer.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:抑制电流崩塌的发生。解决方案:氮化物基半导体外延晶片包括:基板;形成在基板上并由氮化铝组成的成核层;形成在成核层上并由氮化镓组成的缓冲层;阻挡层形成在缓冲层上,由氮化铝镓构成。阻挡层中的硅浓度和氧浓度的总浓度高于阻挡层中的碳浓度。;版权所有:(C)2014,日本特许厅&INPIT

著录项

  • 公开/公告号JP2014090065A

    专利类型

  • 公开/公告日2014-05-15

    原文格式PDF

  • 申请/专利权人 HITACHI CABLE LTD;

    申请/专利号JP20120238902

  • 发明设计人 FUJIKAWA KAZUNARI;

    申请日2012-10-30

  • 分类号H01L29/812;H01L29/778;H01L21/338;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:39

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