首页> 外国专利> SILICON CARBIDE DIODE, SILICON CARBIDE TRANSISTOR, AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE

SILICON CARBIDE DIODE, SILICON CARBIDE TRANSISTOR, AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE

机译:碳化硅二极管,碳化硅晶体管以及制造碳化硅半导体器件的方法

摘要

PROBLEM TO BE SOLVED: To provide a silicon carbide diode which can be reduced in contact resistance between a p-type region and an electrode, and to provide a silicon carbide transistor and a method of manufacturing a silicon carbide semiconductor device.;SOLUTION: The method of manufacturing a silicon carbide semiconductor device 1 comprises the following steps of: preparing a silicon carbide substrate 10 including a p-type region 2a and an n-type region 14 being in contact with the p-type region 2a; heating the p-type region 2a in an atmospheric gas containing a halogen element to form a carbon region 6 being in contact with the p-type region 2a; forming a first metal layer 5 being in contact with the carbon region 6; and heating the carbon region 6 and the first metal layer 5 to form an electrode 8 being in contact with the p-type region 2a.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种可以减小p型区域与电极之间的接触电阻的碳化硅二极管,并且提供一种碳化硅晶体管和一种制造碳化硅半导体器件的方法。碳化硅半导体器件1的制造方法包括以下步骤:准备包括p型区域2a和与p型区域2a接触的n型区域14的碳化硅衬底10。在含有卤素元素的大气中加热p型区域2a,形成与p型区域2a接触的碳区域6。形成与碳区域6接触的第一金属层5;并加热碳区域6和第一金属层5以形成与p型区域2a接触的电极8 。;版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014127660A

    专利类型

  • 公开/公告日2014-07-07

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC IND LTD;

    申请/专利号JP20120285143

  • 发明设计人 WADA KEIJI;MASUDA TAKEYOSHI;

    申请日2012-12-27

  • 分类号H01L21/28;H01L29/872;H01L29/47;H01L21/329;H01L29/06;H01L29/78;H01L29/12;H01L21/336;H01L29/739;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:08

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