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CALIBRATION SYSTEM OF ELECTROMAGNETIC CURRENT METER, COMPUTATION SYSTEM OF CALIBRATION COEFFICIENT, AND METHOD THEREOF

机译:电磁电流表校准系统,校准系数计算系统及其方法

摘要

PROBLEM TO BE SOLVED: To provide a calibration system of an electromagnetic current meter, which is capable of suitably calibrating a measurement current velocity measured by the electromagnetic current meter regardless of the change in arrangement pattern of a structure in accordance with the changed arrangement pattern of the structure.;SOLUTION: A calibration system 50 of an electromagnetic current meter 1 includes: the electromagnetic current meter 1 which is provided adjacently to a structure taking a prescribed arrangement pattern and measures a current velocity of a fluid flowing in a narrow part around the adjacent structure, as a measurement current velocity; and a control device 11 which acquires a calibration coefficient associated with the arrangement pattern of the structure adjacent to the electromagnetic current meter 1, out of a plurality of calibration coefficients associated with a plurality of arrangement patterns of the structure and calibrates the measurement current velocity measured by the electromagnetic current meter 1, on the basis of the acquired calibration coefficient and computes the calibrated measurement current velocity as a calibrated current velocity.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种电磁电流计的校准系统,其能够根据结构的布置模式的改变而适当地校准由电磁电流表测量的测量电流速度,而与结构的布置模式的改变无关。解决方案:电磁流量计1的校准系统50包括:电磁流量计1,其与采用预定布置图案的结构相邻设置,并测量在流体周围狭窄部分中流动的流体的当前速度。相邻结构,作为测量电流速度;控制装置11,其从与所述多个结构的配置图案相关联的多个校准系数中取得与所述电磁电流计1相邻的结构的配置图案相关联的校准系数,并对所测量的测量电流速度进行校准电磁流量计1在获取的校准系数的基础上,将校准后的测量电流速度计算为校准电流速度。COPYRIGHT:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014153093A

    专利类型

  • 公开/公告日2014-08-25

    原文格式PDF

  • 申请/专利权人 MITSUBISHI HEAVY IND LTD;

    申请/专利号JP20130020886

  • 发明设计人 NISHIDA KEIGO;

    申请日2013-02-05

  • 分类号G01P5/08;G01P21/02;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:55

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