CIRCUIT TO PREVENT PEAK POWER PROBLEMS DURING SCAN SHIFT

摘要

PROBLEM TO BE SOLVED: To provide scanning technics.;SOLUTION: A chip comprises first and second scan chain segments, and each segment comprises registers and multiplexers to provide scan input signals to the registers during a scan input period and captured output signals during a capture period. The chip also comprises a circuit to provide first and second test clock signals to the registers of the first and second scan chain segments, respectively. The second test clock signal is provided by a signal path in the circuit during the scan input period different from a signal path during the capture period, and during the scan input period a second test clock signal is skewed with respect to a first test clock signal. Other embodiments are described and claimed.;COPYRIGHT: (C)2014,JPO&INPIT