首页> 外国专利> THREE-DIMENSIONAL SHAPE MEASUREMENT X-RAY CT DEVICE AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD BY X-RAY CT DEVICE

THREE-DIMENSIONAL SHAPE MEASUREMENT X-RAY CT DEVICE AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD BY X-RAY CT DEVICE

机译:X射线CT装置的三维形状测量和X射线CT装置的三维形状测量方法

摘要

PROBLEM TO BE SOLVED: To provide a three-dimensional shape measurement X-ray CT device capable of highly accurately extracting three-dimensional shape information by taking into account a quality hardening phenomenon dependent on the material/thickness of a target substance, and a three-dimensional shape measurement method by the X-ray CT device.SOLUTION: A three-dimensional shape measurement X-ray CT device includes an optical distance meter for measuring the outer shape of a target substance simultaneously with projection data measurement, and a CT image analyzer for calculating the boundary threshold of the target substance based on a CT image and an outer shape measured value. The three-dimensional shape measurement X-ray CT device capable of highly accurately extracting three-dimensional shape information by taking into account a quality hardening phenomenon dependent on the material/thickness of a target substance, and a three-dimensional shape measurement method by the X-ray CT device are provided.
机译:要解决的问题:提供一种三维形状测量X射线CT装置,该装置能够通过考虑取决于目标物质的材料/厚度的质量硬化现象来高精度地提取三维形状信息,以及解决方案:一种三维形状测量X射线CT设备包括一个光学测距仪,用于在测量投影数据的同时测量目标物质的外形,以及CT图像分析器基于CT图像和外形测量值计算目标物质的边界阈值。通过考虑到取决于目标物质的材料/厚度的质量硬化现象,能够高精度地提取三维形状信息的三维形状测量X射线CT装置,以及通过该三维形状测量方法的三维形状测量方法提供X射线CT装置。

著录项

  • 公开/公告号JP2014009976A

    专利类型

  • 公开/公告日2014-01-20

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20120144907

  • 发明设计人 SADAOKA NORIYUKI;NAGUMO YASUSHI;

    申请日2012-06-28

  • 分类号G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:09

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