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Plasma electron density and electron temperature of the measuring probe and measurement device

机译:测量探针和测量装置的等离子体电子密度和电子温度

摘要

PROBLEM TO BE SOLVED: To provide a measurement probe and a measurement device that are compact, and measure the electron density and electron temperature of plasma in a simple method without using an expensive measurement device.;SOLUTION: A measurement probe 10 includes two antennas 12 and 13 composed of metal wires differing in length, and the antennas each have two parallel metal wires bent and arranged in a rectangular plane area A and also are connected at one end in a U shape. The antennas 12 and 13 are sandwiched between insulating layers 14 and 15 differing in thickness, and configured to differ in sheath thickness dependence of resonance frequencies corresponding to the respective antennas. Consequently, electron density ne and electron temperature Te of the plasma can be calculated from resonance frequency dependency of the electron density ne and the electron temperature Te of the plasma.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供紧凑的测量探针和测量装置,并且以简单的方法测量等离子体的电子密度和电子温度,而无需使用昂贵的测量装置。解决方案:测量探针10包括两个天线12天线13和13由长度不同的金属线构成,并且天线分别具有弯曲并布置在矩形平面区域A中的两条平行的金属线,并且在一端以U形连接。天线12和13被夹在厚度不同的绝缘层14和15之间,并且被配置为在与各个天线相对应的谐振频率的护套厚度依赖性上不同。因此,可以根据电子密度n e 与电子密度n e 的共振频率相关性来计算等离子体的电子密度n e 和电子温度T e 。电子温度T e .; COPYRIGHT:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP5618446B2

    专利类型

  • 公开/公告日2014-11-05

    原文格式PDF

  • 申请/专利权人 学校法人中部大学;

    申请/专利号JP20100182181

  • 发明设计人 菅井 秀郎;中村 圭二;

    申请日2010-08-17

  • 分类号H05H1/00;H05H1/46;C23C16/50;H01L21/3065;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-21 16:13:35

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