首页> 外国专利> A method for discriminating backscattered and incident electrons in an imaging electron detector with a thin electron sensitive layer.

A method for discriminating backscattered and incident electrons in an imaging electron detector with a thin electron sensitive layer.

机译:一种在具有薄的电子敏感层的成像电子检测器中区分反向散射和入射电子的方法。

摘要

Method of operating a device having a high energy particle detector is disclosed, the particles, the first incident transverse event, backscattered out of the device, contact near the mechanical structure, scattered back in the device, the particles resulting emitted backward scattering events, higher input and output events, as well as to generate an incident event. Exemplary method steps, by a separate event limits the dose rate to a level that ensures that no overlap, based on the total energy of each event, to discriminate the event and background and other events, based on the electron path shape, by discriminating between the incident cross events backscatter events, or, it is determined that the first event and the second event is to coincide with each other, the incident event on the basis of the electron path shape and energy level by separating from backscatter events, including the first incident crossing events, the outgoing backscatter event, higher input and output events, as well as to discriminate the incident event.
机译:公开了一种操作具有高能粒子检测器的装置的方法,该粒子,第一入射横向事件,从装置反向散射,在机械结构附近接触,在装置中向后散射,导致产生的粒子向后散射事件,更高输入和输出事件,以及生成事件事件。示例性的方法步骤通过单独的事件将剂量率限制在一个水平,该水平确保基于每个事件的总能量没有重叠,从而通过电子路径的形状来区分事件和背景以及其他事件,入射交叉事件后向散射事件,或者确定第一事件和第二事件彼此重合,基于电子路径形状和能级,通过与后向散射事件(包括第一事件)分离,确定入射事件事件穿越事件,传出的反向散射事件,较高的输入和输出事件,以及对事件的区分。

著录项

  • 公开/公告号JP5540088B2

    专利类型

  • 公开/公告日2014-07-02

    原文格式PDF

  • 申请/专利权人 ガタン インコーポレイテッド;

    申请/专利号JP20120517786

  • 发明设计人 ムーニー、ポール;

    申请日2010-06-25

  • 分类号H01J37/244;G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-21 16:13:16

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