首页> 外国专利> Production manner of the suffering processed substrate and the said suffering processed substrate where the resist film and the organicity conductive film for the electronic beam are laminated, and formation manner of resist pattern

Production manner of the suffering processed substrate and the said suffering processed substrate where the resist film and the organicity conductive film for the electronic beam are laminated, and formation manner of resist pattern

机译:层压了电子束的抗蚀剂膜和有机导电膜的受灾处理基板和所述受灾处理基板的制造方式以及抗蚀剂图案的形成方式

摘要

There is disclosed a substrate to be processed having laminated thereon a resist film for electron beam and an organic conductive film, in which at least a resist film for electron beam and ah organic conductive film are laminated in order on a substrate to be processed having a conductive inorganic thin film as its surface layer, wherein a surface to be processed of the substrate to be processed has an area of direct contact between the organic conductive film and the conductive inorganic thin film in part thereof. There can be a substrate to be processed capable of forming a resist pattern stably and accurately with efficient removal of electricity even when an electron beam with high current density is irradiated.
机译:公开了一种其上层压有用于电子束的抗蚀剂膜和有机导电膜的待处理基板,其中至少依次将用于电子束的抗蚀剂膜和有机导电膜层压在具有如下结构的待处理基板上:导电无机薄膜作为其表面层,其中待处理基板的待处理表面在有机导电膜与导电无机薄膜的一部分之间具有直接接触的面积。能够提供即使在照射高电流密度的电子束的情况下也能够稳定且正确地形成抗蚀剂图案且有效地除去电的被处理基板。

著录项

  • 公开/公告号JP5368392B2

    专利类型

  • 公开/公告日2013-12-18

    原文格式PDF

  • 申请/专利权人 信越化学工業株式会社;

    申请/专利号JP20100165767

  • 发明设计人 渡邉 聡;吉川 博樹;

    申请日2010-07-23

  • 分类号G03F1/40;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 16:12:28

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号