首页> 外国专利> CHEMICAL MECHANICAL POLISHING METHODS AND SYSTEMS INCLUDING PRE-TREATMENT PHASE AND PRE-TREATMENT COMPOSITIONS

CHEMICAL MECHANICAL POLISHING METHODS AND SYSTEMS INCLUDING PRE-TREATMENT PHASE AND PRE-TREATMENT COMPOSITIONS

机译:化学机械抛光方法和系统,包括前处理阶段和前处理组成

摘要

In one aspect, a substrate chemical mechanical polishing (CMP) method for copper-layered substrates is disclosed. The CMP method includes providing a substrate having a surface of copper, and pre-treating the surface containing copper with a first composition containing a carrier liquid, a corrosion inhibitor, and an oxidizer in a pre-treatment phase, and thereafter, polishing the surface with a slurry composition in a main polishing phase. CMP systems and compositions for CMP are provided, as are numerous other aspects.
机译:一方面,公开了一种用于铜层基板的基板化学机械抛光(CMP)方法。该CMP方法包括:提供具有铜表面的基板;以及在预处理阶段用包含载液,腐蚀抑制剂和氧化剂的第一组合物预处理包含铜的表面,然后抛光该表面。在主抛光阶段使用浆料组合物。提供了CMP系统和用于CMP的组合物,以及许多其他方面。

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