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Oscillato based on a 6T SRAM for measuring the bias temperature instability

机译:基于6T SRAM的Oscillato,用于测量偏置温度不稳定性

摘要

The present invention provides an oscillator which is based on a 6T SRAM for measuring the Bias Temperature Instability. The oscillator includes a first control unit, a first inverter, a second control unit, and a second inverter. The first control unit is coupled with the first inverter. The second control unit is coupled with the second inverter. The first control unit and the second control unit is used to control the first inverter and the second inverter being selected, biased, and connected respectively, so that the NBTI and the PBTI of the SRAM can be measured separately, and the real time stability of the SRAM can be monitored immediately.
机译:本发明提供了一种基于6T SRAM的振荡器,用于测量偏置温度不稳定性。振荡器包括第一控制单元,第一反相器,第二控制单元和第二反相器。第一控制单元与第一逆变器耦合。第二控制单元与第二逆变器耦合。第一控制单元和第二控制单元用于控制分别选择,偏置和连接第一逆变器和第二逆变器,从而可以分别测量SRAM的NBTI和PBTI,并具有实时稳定性。可以立即监视SRAM。

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