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System and method for improved resolution, higher scan speeds and reduced processing time in scans involving swept-wavelength interferometry
System and method for improved resolution, higher scan speeds and reduced processing time in scans involving swept-wavelength interferometry
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机译:用于在涉及扫频干涉仪的扫描中提高分辨率,提高扫描速度并减少处理时间的系统和方法
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摘要
A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.
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