首页> 外国专利> Nonvolatile memory device including sudden power off detection circuit and sudden power off detection method thereof

Nonvolatile memory device including sudden power off detection circuit and sudden power off detection method thereof

机译:包括突然断电检测电路的非易失性存储装置及其突然断电检测方法

摘要

A nonvolatile memory device includes a memory cell array comprising memory cells connected to bit lines and word lines; a word line decoder configured to apply word line voltages to the word lines; a bit line selector configured to select at least one bit line of the bit lines; a control logic configured to control the word line decoder and the bit line selector so that write data is programmed in the memory cell array; and a sudden power off (SPO) detection circuit, wherein the SPO detection circuit comprises: a sensing cell; a first driver configured to provide a first voltage to the sensing cell; and a second driver configured to provide a second voltage to the sensing cell, wherein a program state of the sensing cell becomes different depending on an order or a time difference between the first driver and the second driver being powered off.
机译:一种非易失性存储器件,包括:存储单元阵列,其包括连接到位线和字线的存储单元;字线解码器,被配置为向字线施加字线电压;位线选择器,被配置为选择位线中的至少一条位线;控制逻辑,被配置为控制字线解码器和位线选择器,以便在存储单元阵列中对写数据进行编程; SPO检测电路,其包括:感测单元;以及第一驱动器,被配置为向感测单元提供第一电压;第二驱动器,被配置为向感测单元提供第二电压,其中,感测单元的编程状态根据第一驱动器和第二驱动器断电之间的顺序或时间差而变得不同。

著录项

  • 公开/公告号US8873328B2

    专利类型

  • 公开/公告日2014-10-28

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201314037544

  • 发明设计人 OH-SEONG KWON;YONG SHIK SHIN;YUNSEOK YANG;

    申请日2013-09-26

  • 分类号G11C11/00;G11C11/14;G11C5/14;G11C11/16;

  • 国家 US

  • 入库时间 2022-08-21 16:03:39

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