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Method for thin die-to-wafer bonding

机译:薄晶片对晶片接合的方法

摘要

A method is provided for bonding a die to a base technology wafer and includes: providing a device wafer having a front, back, at least one side, and at least one TSV, wherein the back contains a substrate material; providing a carrier wafer having a front, back, and at least one side; bonding the wafers using an adhesive; removing the substrate material and wet etching, from the device wafer's back side, to expose at least one metallization scheme feature; processing the device wafer's back side to create at least one backside redistribution layer; removing the device wafer from the carrier wafer; dicing the device wafer into individual die; providing a base technology wafer; coating the front of the base technology wafer with a sacrificial adhesive; placing the front of the individual die onto the front of the base technology wafer; and bonding the individual die to the base technology wafer.
机译:提供了一种用于将管芯结合至基础技术晶片的方法,该方法包括:提供具有正面,背面,至少一个侧面和至少一个TSV的器件晶片,其中背面包含衬底材料;提供具有正面,背面和至少一侧的载体晶片;用粘合剂粘结晶片;从器件晶片的背面去除衬底材料并进行湿法蚀刻,以暴露至少一个金属化方案特征;处理器件晶片的背面,以形成至少一个背面再分布层;从载体晶片上去除器件晶片;将器件晶圆切成单个管芯;提供基础技术晶片;用牺牲粘合剂涂覆基础技术晶片的正面;将单个管芯的正面放在基础技术晶圆的正面;然后将单个管芯粘合到基础技术晶圆上。

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