首页> 外国专利> Memory devices and programming methods that program a memory cell with a data value, read the data value from the memory cell and reprogram the memory cell with the read data value

Memory devices and programming methods that program a memory cell with a data value, read the data value from the memory cell and reprogram the memory cell with the read data value

机译:使用数据值对存储单元进行编程,从存储单元读取数据值并使用读取的数据值对存储单元进行重新编程的存储设备和编程方法

摘要

Memory devices and programming methods are disclosed. In an embodiment of one such method, a memory cell is programmed to at least a first threshold voltage. After programming the memory cell to at least the first threshold voltage, the memory cell is read, using a read voltage that is less than the first threshold voltage. After reading the memory cell, the memory cell is programmed to at least a second threshold voltage that is greater than the first threshold voltage.
机译:公开了存储装置和编程方法。在一个这样的方法的实施例中,将存储单元编程为至少第一阈值电压。在将存储单元编程为至少第一阈值电压之后,使用小于第一阈值电压的读取电压来读取存储单元。在读取存储单元之后,将存储单元编程为至少第二阈值电压,该第二阈值电压大于第一阈值电压。

著录项

  • 公开/公告号US8743622B2

    专利类型

  • 公开/公告日2014-06-03

    原文格式PDF

  • 申请/专利权人 TORU TANZAWA;

    申请/专利号US201213349652

  • 发明设计人 TORU TANZAWA;

    申请日2012-01-13

  • 分类号G11C16/04;

  • 国家 US

  • 入库时间 2022-08-21 16:01:10

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