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Orientation imaging using wide angle convergent beam diffraction in transmission electron microscopy
Orientation imaging using wide angle convergent beam diffraction in transmission electron microscopy
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机译:透射电子显微镜中使用广角会聚束衍射进行定向成像
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摘要
Methods of orientation imaging microscopy (OIM) techniques generally performed using transmission electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed may use a wide angle convergent beam electron diffraction for performing OIM by generating a diffraction pattern having at least three diffraction discs that may provide additional information that is not available otherwise.
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