Low-cost and pixel-accurate test method and apparatus for testing pixel generation circuits

摘要

A method and system of testing pixels output from a pixel generation unit under test includes generating pixels from the pixel generation unit under test using a first test data pattern to generate pixel information. The method and system also generate a per pixel error value for a pixel from the unit under test that contains an error based on the pixel by pixel comparison with pixel information generated substantially concurrently with pixels by a different unit using the first test data pattern. If desired, corresponding pixel screen location information (e.g., x-y location) can also be determined for the pixel that has the error. The per pixel error and x-y location information can be displayed.