机译:基于结构的组合电路多故障测试生成算法
Electrical & Electronic Engineering College, Harbin University of Science and Technology, Harbin 150040, China;
College of Measure-control Technology & Communication Engineering, Harbin University of Science Technology, Harbin 150040 ,China;
College of Measure-control Technology & Communication Engineering, Harbin University of Science Technology, Harbin 150040 ,China;
combinational circuit; test generation; the smallest test patterns set;