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Methods of programming and erasing programmable metallization cells (PMCs)

机译:编程和擦除可编程金属化单元(PMC)的方法

摘要

An integrated circuit can include a plurality of programmable metallization cells (PMCs) in a memory array, each PMC comprising an ion conducting material, an active metal dissolvable in the ion conducting material, and two electrodes, a first electrode of at least one PMC being coupled to a program node; and a plurality of program and verify circuits, each including a current source section to enable at least one current path between the program node and a power supply node in a program and verify operation, and a verify signal generator circuit comprising at least a first comparator having a first input coupled to the program node, a second input coupled to receive a first reference voltage, and a comparator output to provide a verify signal that indicates a program operation is complete.
机译:集成电路可包括存储器阵列中的多个可编程金属化单元(PMC),每个PMC包括离子导电材料,可溶于该离子导电材料的活性金属和两个电极,至少一个PMC的第一电极为耦合到程序节点;多个编程和验证电路,每个电路包括电流源部分,以在编程和验证操作中启用程序节点和电源节点之间的至少一条电流路径;以及验证信号发生器电路,包括至少一个第一比较器具有耦合到编程节点的第一输入,耦合以接收第一参考电压的第二输入,以及比较器输出以提供指示编程操作已完成的验证信号。

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