METHOD FOR MONITORING AND DETERMINING THE PROPERTIES OF LIGHT-SCATTERING SURFACE TEXTURES AND FOR REGULATING THE PRODUCTION PROCESS OF LIGHT-SCATTERING SURFACE TEXTURES.

摘要

The invention relates to a method for monitoring and determining the properties of light-scattering surface textures and for regulating the production process of light-scattering surface textures using angle-resolved scattered light (ARS) measurements, comprising the following method steps: a) at least one parameter is selected from angle-resolved scattered light (ARS) measured values, which is calculated from at least one measured value associated with a scattering angle range and/or from the entire ARS wave shape, b) a desired value is established for the selected parameter, c) at least one condition of the production process of the surface texture is correlated with the previously selected parameter, d) a light-scattering surface texture (O_i) is produced, e) an angle-resolved scattered light (ARS) measurement of said surface texture (O_i) is carried out, f) the production process is regulated by modifying at least one condition of the subsequent production process for the surface texture (O_k, with ki), g) steps d) - e) are repeated for surface textures (O_k, with ki) and the regulation according to step f) is continued until the variation of the actual value of the selected parameter determined by means of ARS measurement from the desired value is ≤ 20%.