首页> 外国专利> AUTOMATIC POSITIONING AND ADAPTATION IN AN ADJUSTMENT METHOD FOR A SHIM FIELD MAP BASED ON AUTOALIGN AND AUTOCOVERAGE

AUTOMATIC POSITIONING AND ADAPTATION IN AN ADJUSTMENT METHOD FOR A SHIM FIELD MAP BASED ON AUTOALIGN AND AUTOCOVERAGE

机译:基于自动对齐和自动覆盖的调整场地图调整方法中的自动定位和自适应

摘要

A circuit for controlling a microscope by means of a control device, wherein the circuit is composed of a slow memory (1) for storing control information, and wherein the control device (7) for controlling of parameters of the microscope based on the control information, is designed to achieve an as high as possible data throughput, characterized in that the circuit a data loading unit (3) and at least two fast memory (4.1, 4.2), wherein the data loading unit (3) is configured in such a way that control information from the slow memory (1) alternately in one of the at least two fast memory (4.1, 4.2) are written, that the circuit is composed of a multiplexer (5) which has a alternating access by the control device (7) to one of the at least two fast memory (4.1, 4.2) for reading of control information, and that the data loading unit (3) in such a way for controlling of the multiplexer (5) is designed, that a writing by the data loading unit (3) and a reading process by the control device (7) is not simultaneously on the same rapid memory (4.1, 4.2) is carried out. According to another aspect, the circuit is characterized in that m separate data drawer unit (3) with an associated fast memory (4.1, 4.2) are formed, wherein 1 ≦ m n and wherein in each case one of the data loading units (3) a, which is to be controlled, is associated with parameters of the microscope, that the data loading units (3) are designed in such a way that the part of the control information in the respective rapid memory (4.1, 4.2) is loaded by the respective data of the charging unit (3), which is to be controlled parameters of the microscope, and that the circuit a switching network (6) that has an access to the in the m rapid storing (4.1, 4.2) of control information stored by the control device (3) over the n conduits enables. Corresponding processes are given.
机译:一种通过控制装置控制显微镜的电路,其中该电路由用于存储控制信息的慢速存储器(1)组成,并且其中控制装置(7)用于基于控制信息控制显微镜的参数被设计成实现尽可能高的数据吞吐量,其特征在于该电路具有数据加载单元(3)和至少两个快速存储器(4.1、4.2),其中数据加载单元(3)被配置为这样,将来自慢速存储器(1)的控制信息交替写入至少两个快速存储器(4.1、4.2)之一中,电路由一个多路复用器(5)组成,该多路复用器(5)可以由控制设备( 7)到至少两个快速存储器(4.1、4.2)中的一个,用于读取控制信息,并且设计了用于控制多路复用器(5)的方式的数据加载单元(3),数据加载单元(3)和控制装置的读取过程ce(7)不能同时在同一快速存储器(4.1,4.2)上执行。根据另一方面,该电路的特征在于,形成具有相关联的快速存储器(4.1、4.2)的m个单独的数据抽屉单元(3),其中1≤m<n,并且其中在每种情况下,数据加载单元中的一个( 3)将要控制的a与显微镜的参数相关联,以使得数据加载单元(3)被设计为使得相应快速存储器(4.1、4.2)中的控制信息的一部分为由充电单元(3)的相应数据加载,该数据将是显微镜的控制参数,并且该电路通过一个交换网络(6)来访问m的快速存储(4.1、4.2)由控制装置(3)在n个导管上存储的控制信息启用。给出了相应的过程。

著录项

  • 公开/公告号KR20130129126A

    专利类型

  • 公开/公告日2013-11-27

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号KR20130054979

  • 发明设计人 PAUL DOMINIK;SCHMITT BENJAMIN;

    申请日2013-05-15

  • 分类号A61B5/055;

  • 国家 KR

  • 入库时间 2022-08-21 15:44:55

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