首页> 外国专利> ELECTRIOMAGNETIC/VISUAL COMPLEX SENSOR FOR MEASURING NOISE OF ELECTROMAGNETIC WAVE, AND METHOD FOR MEASURING NOISE OF ELECTROMAGNETIC WAVE USING THE SAME

ELECTRIOMAGNETIC/VISUAL COMPLEX SENSOR FOR MEASURING NOISE OF ELECTROMAGNETIC WAVE, AND METHOD FOR MEASURING NOISE OF ELECTROMAGNETIC WAVE USING THE SAME

机译:用于测量电磁波噪声的电磁/视觉复合传感器,以及使用该传感器测量电磁波噪声的方法

摘要

The present invention relates to an electromagnetic and visual complex sensor for measuring electromagnetic wave noise and a method for measuring electromagnetic wave noise using the same. The complex sensor of the present invention comprises an electric field probe for detecting electric field noise output from an electronic device, a magnetic field probe for detecting magnetic field noise, and a chip-type small camera, wherein an electromagnetic sensor and a video camera comprising the magnetic field probe and the electric field probe are integrally formed. Therefore, the present invention can measure an electric field and magnetic field at the same time, and measure electromagnetic noise without using a position extraction camera by incorporating the camera into the sensor, thereby improving the convenience of the electromagnetic noise measurement.
机译:本发明涉及一种用于测量电磁波噪声的电磁视觉复合传感器以及使用该传感器的电磁波噪声测量方法。本发明的复合传感器包括用于检测从电子设备输出的电场噪声的电场探头,用于检测磁场噪声的磁场探头以及芯片型小型照相机,其中,电磁传感器和摄像机包括:磁场探头和电场探头一体形成。因此,本发明可以通过将摄像机并入传感器中而同时测量电场和磁场,并且在不使用位置提取摄像机的情况下测量电磁噪声,从而提高了电磁噪声测量的便利性。

著录项

  • 公开/公告号KR101416573B1

    专利类型

  • 公开/公告日2014-08-06

    原文格式PDF

  • 申请/专利权人 EMCIS CO. LTD.;

    申请/专利号KR20140021666

  • 发明设计人 KIM CHEOL SOO;PARK YONG BAE;

    申请日2014-02-25

  • 分类号G01R29/08;G01R1/07;

  • 国家 KR

  • 入库时间 2022-08-21 15:40:35

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