首页> 外国专利> ELECTROMAGNETIC NOISE MEASURING MAGNETIC FIELD PROBE, ELECTROMAGNETIC NOISE MEASURING ELECTRIC FIELD PROBE AND ELECTROMAGNETIC NOISE MEASURING APPARATUS

ELECTROMAGNETIC NOISE MEASURING MAGNETIC FIELD PROBE, ELECTROMAGNETIC NOISE MEASURING ELECTRIC FIELD PROBE AND ELECTROMAGNETIC NOISE MEASURING APPARATUS

机译:电磁噪声测量磁场探头,电磁噪声测量电场探头和电磁噪声测量装置

摘要

PURPOSE: To provide an electromagnetic noise measuring magnetic field probe and an electromagnetic noise measuring electric field probe which have small size and weight and are not affected by the influence of external noise. ;CONSTITUTION: Shielding films 61, 62, 561, 562 are provided on the front and rear surfaces of printed boards 3, 53 having a front surface, an intermediate layer and a rear surface, a coil pattern 9 or an electric field detecting pattern 59 is provided on the layer, and window opening parts 111, 112 are respectively provided at the films 61, 62, 561, 562 so that a magnetic flux or an electromagnetic wave arrives at the pattern 9 or 59 to constitute an electromagnetic noise measuring magnetic field probe 2 and an electromagnetic noise measuring electric field probe 52. Since it is formed of the boards, it can be reduced in size and weight, mounted in a probe scanner, and provided with high shielding properties.;COPYRIGHT: (C)1996,JPO
机译:目的:提供一种电磁噪声测量磁场探头和电磁噪声测量电场探头,它们体积小,重量轻,不受外界噪声的影响。 ;构成:在正面和背面分别设置屏蔽膜6 1 ,6 2 ,56 1 ,56 2 。具有前表面,中间层和后表面的印刷电路板3、53的后表面,线圈图案9或电场检测图案59设置在该层上,并且窗开口部11 1 ,11 2 分别设置在薄膜6 1 ,6 2 ,56 1 ,56 2 ,以使磁通量或电磁波到达图案9或59,从而构成电磁噪声测量磁场探头2和电磁噪声测量电场探头52。由于其由板形成,它可以减小尺寸和重量,安装在探针扫描仪中,并具有很高的屏蔽性能。;版权所有:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH08248080A

    专利类型

  • 公开/公告日1996-09-27

    原文格式PDF

  • 申请/专利权人 KANAGAWA PREF GOV;

    申请/专利号JP19950077089

  • 发明设计人 SUGAMA HIDEAKI;

    申请日1995-03-09

  • 分类号G01R29/08;G01R31/00;G01R33/02;H05K1/16;

  • 国家 JP

  • 入库时间 2022-08-22 04:02:48

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