NOISE MEASURING DEVICE OF A CIRCUIT DEVICE INTEGRATED WITH AN IMAGE SENSOR CAPABLE OF PROVIDING OBJECTIVE PRODUCT NOISE LEVELS BY EVALUATING ELECTROMAGNETIC WAVE NOISE

摘要

PURPOSE: A noise measuring device of a circuit device integrated with an image sensor is provided to utilize a space arrangement design by considering of the electromagnetic wave noise level of the integrated circuit device in the design of a camera module.;CONSTITUTION: A noise measuring device (10) comprises an electromagnetic interface (EMI) test jig (110), an electromagnetic shielding box (120), an electromagnetic measuring probe (130), a spectrum analyzer (140), and a noise level assessment unit (150). The EMI test jig operates a circuit device integrated with an image sensor based on a test condition. The electromagnetic shielding box storages the EMI test jig and block the insertion of an electromagnetic wave. The electromagnetic wave measuring probe senses electromagnetic wave noise radiated from the integrated circuit device to the air. The spectrum analyzer measures the electronic wave noise radiated to the air by connecting to the electronic wave measuring probe.;COPYRIGHT KIPO 2013