首页> 外国专利> Method of increasing energy band gap of crystalline aluminum oxide layer and method of manufacturing charge trap memory device comprising crystalline aluminum oxide layer having high energy band gap

Method of increasing energy band gap of crystalline aluminum oxide layer and method of manufacturing charge trap memory device comprising crystalline aluminum oxide layer having high energy band gap

机译:增加结晶氧化铝层的能带隙的方法和包括具有高能带隙的结晶氧化铝层的电荷陷阱存储器件的制造方法

摘要

This invention provides a method for increasing band gap of aluminum oxide layer and a method for manufacturing charge trapping storage device, namely, this invention provides a charge trapping storage device comprising crystal aluminum oxide with increased band gap and crystal aluminum oxide layer, and manufacture method thereof. A method for increasing band gap of aluminum oxide layer comprises: forming non-crystal aluminum oxide layer on lower film; introducing hydrogen (H) or hydroxyl (OH) in the non-crystal aluminum oxide layer, in order to realize crystallization of non-crystal aluminum oxide containing H or OH.
机译:本发明提供了一种增加氧化铝层的带隙的方法和一种电荷陷阱存储装置的制造方法,即,本发明提供了一种包括带隙增加的晶体氧化铝和晶体氧化铝层的电荷陷阱存储装置及其制造方法其。一种增加氧化铝层带隙的方法,包括:在下膜上形成非晶氧化铝层;为了实现含有H或OH的非晶态氧化铝的结晶化,在非晶态氧化铝层中引入氢(H)或羟基(OH)。

著录项

  • 公开/公告号KR101446333B1

    专利类型

  • 公开/公告日2014-10-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080039458

  • 申请日2008-04-28

  • 分类号H01L21/8247;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 15:39:59

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