METHOD OF PARAMETER MEASUREMENT FOR SINGLE-PHOTON INFRARED BAND EMISSION SOURCES

摘要

FIELD: measuring instrumentation.;SUBSTANCE: parameters of emission source are measured by single-photon superconductor detector. To implement the method, mean number of counts and number of dark responses of detector are measured. Number of photons registered is determined as a difference between mean number of counts and number of dark responses. Emission power is determined by multiplying number of registered photons by photon energy divided by quantum efficiency of emission receiver.;EFFECT: enhanced measurement accuracy and possible measurement of small power emission.;2 cl, 6 dwg