首页> 外国专利> A process for the correction of a measured value of a machine for measuring the surface structure and machine for measuring the surface structure

A process for the correction of a measured value of a machine for measuring the surface structure and machine for measuring the surface structure

机译:用于校正用于测量表面结构的机器和用于测量表面结构的机器的测量值的方法

摘要

A process for the correction of a measured value for a machine for the measurement of the surface structure, wherein the machine comprises: a stand (d), the upright on a base (a) of the machine; a vertically movable table (e), which is mounted in such a way that it is vertically with respect to the stand (d) can be moved; a v-axis detector (13), of a vertical displacement amount of the vertically movable table (e) in relation to the stand (d); a horizontal x-axis guide (17), responsive to the vertically movable table (e) is arranged; a slider (18), which along the x-axis guide (17) is guided, and a z-axis detector (27), which detects a surface structure of an object; and a x-axis detector (74), the one horizontal shift amount x of the slider (18) with respect to the x-axis guide (17) determines said method comprising:an error calculating step calculates, in which as a result of a deformation of the stand error amounts occurring with respect to the x-axis and z-axis at a reference position of the vertically movable table are calculated from a height v of a base portion of the stand to the reference position of the vertically movable table, wherein the height v of the v-axis detector is obtained, and from a horizontal shift amount x from a reference position of the x-axis guide to the position of the centre of gravity (g) of the slider (18), wherein the horizontal shift amount x from the x-axis detector (74) is obtained; andan error correction step uses, in which a measuring result at least one of the x-axis detector or of the z-axis detector is corrected in accordance with the error amount, which is obtained in the case of the error calculating step calculates,the error correction step uses comprises: ..
机译:一种用于校正用于测量表面结构的机器的测量值的方法,其中,所述机器包括:支架(d),所述机器的基座(a)上的立柱;可垂直移动的工作台(e),其相对于支架(d)垂直安装,可移动;垂直移动台(e)相对于支架(d)的垂直位移量的v轴检测器(13);响应于可垂直移动的工作台(e)设置水平的x轴导向器(17)。沿x轴引导件(17)被引导的滑块(18)和检测物体的表面结构的z轴检测器(27)。滑动器(18)相对于x轴导向器(17)的一个水平移动量x确定了所述方法,该方法包括:误差计算步骤,其计算结果为:从支架的基部的高度v到竖直可移动台的参考位置,计算在竖直可移动台的参考位置处相对于x轴和z轴发生的支架误差量的变形。 ,其中,获得v轴检测器的高度v,并从x轴导轨的参考位置到滑块(18)的重心(g)的位置之间的水平偏移量x中,得到来自x轴检测器74的水平移动量x。并且,使用误差校正步骤,其中,根据误差量校正在x轴检测器或z轴检测器中的至少一个的测量结果,该误差量是在误差计算步骤的情况下计算出的,纠错步骤的用途包括:..

著录项

  • 公开/公告号DE10128623B4

    专利类型

  • 公开/公告日2014-09-25

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORP.;

    申请/专利号DE2001128623

  • 申请日2001-06-13

  • 分类号G01B21/30;G01B21/04;G01B21/20;

  • 国家 DE

  • 入库时间 2022-08-21 15:38:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号