SEMICONDUCTOR INTEGRATED CIRCUIT, TESTING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT AND SUPPRESSION METHOD OF RUSH CURRENT IN SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To easily detect a stuck-at fault of each of switches provided in parallel with regions which compose a semiconductor integrated circuit.;SOLUTION: In a semiconductor integrated circuit including a plurality of switch parts for each logic cell, each switch part includes: a power source switch provided on a power source line; a first latch part which latches a power source control signal input to an input terminal, for controlling the power source switch by switching a state to a conduction state or a non-conduction state in accordance with a first latch control signal input to an enable terminal and outputs the latched power source control signal from an output terminal; and a second latch part which latches in accordance with a second latch control signal input to the enable terminal, the power source control signal being to be input to the input terminal and latched by the first latch part, and outputs the power source control signal from the output terminal. The power source control signal output from the second latch part of a first switch part among the plurality of switch parts is input to the input terminal of the first latch part of a second switch part.;COPYRIGHT: (C)2015,JPO&INPIT