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SUPER-JUNCTION MOSFET, MANUFACTURING METHOD THEREFOR, AND COMPOSITE SEMICONDUCTOR DEVICE WITH PARALLEL CONNECTED DIODES

机译:超结MOSFET,其制造方法以及具有并联连接二极管的复合半导体器件

摘要

PROBLEM TO BE SOLVED: To provide a super-junction MOSFET capable of reducing a reverse recovery current (Irp) and a reverse recovery time (trr) by moderating a hard recovery waveform at the time of reverse recovery operation, thereby making it possible to obtain high-speed switching and reduce a reverse recovery loss.;SOLUTION: Provided is a super-junction MOSFET having, on a first main surface of an n-type semiconductor substrate 1, a plurality of pn junctions 6 parallel to each other and extending in the vertical direction, a parallel pn layer 4 in which an n-type drift region 4a and a p-type partition region 4b sandwiched between the pn junctions 6 are juxtaposed adjacent to each other, and a MOS gate structure on the first main surface side of the parallel pn layer 4, an n-type first buffer layer 3 and second buffer layer 2 being in contact therewith in the order stated. The super-junction MOSFET is characterized in that the impurity concentration of the first buffer layer 3 is a low concentration about equal to or less than that of the n-type drift region 4a, the impurity concentration of the second buffer layer 2 is a higher concentration than that of the n-type drift region 4a, and the carrier life time of the n-type semiconductor substrate 1 on the first main surface side is made to be shorter than that of the second buffer layer 2.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种超级结MOSFET,该超级结MOSFET能够通过在反向恢复操作时缓和硬恢复波形来减少反向恢复电流(Irp)和反向恢复时间(trr),从而有可能获得解决方案:提供一种超结MOSFET,在n型半导体衬底1的第一主表面上具有多个彼此平行并延伸的pn结6。在垂直方向上,平行的pn层4彼此相邻并置,在平行的pn层4中,n型漂移区4a和夹在pn结6之间的p型分隔区4b彼此相邻并置,并且MOS栅极结构在第一主表面侧上在平行pn层4中,n型第一缓冲层3和第二缓冲层2以所述顺序与其接触。该超结MOSFET的特征在于,第一缓冲层3的杂质浓度为低浓度,大约等于或小于n型漂移区4a的杂质浓度,第二缓冲层2的杂质浓度较高。使得n型半导体衬底1在第一主表面侧上的载流子寿命比n型漂移区4a的浓度短,并且使n型半导体衬底1在第一主表面侧的载流子寿命短于第二缓冲层2的载流子寿命。 )2015,JPO&INPIT

著录项

  • 公开/公告号JP2015018913A

    专利类型

  • 公开/公告日2015-01-29

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC CO LTD;

    申请/专利号JP20130144654

  • 发明设计人 ONISHI YASUHIKO;TAMURA TAKAHIRO;

    申请日2013-07-10

  • 分类号H01L29/78;H01L21/336;H01L29/06;H01L27/04;H01L29/861;H01L29/868;H01L21/322;H01L29/47;H01L29/872;

  • 国家 JP

  • 入库时间 2022-08-21 15:31:44

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