首页> 外国专利> Surface plasmon excitation fluorescence measurement device and the surface plasmon excitation fluorescence measurement method .

Surface plasmon excitation fluorescence measurement device and the surface plasmon excitation fluorescence measurement method .

机译:表面等离子体激发荧光测量装置及表面等离子体激发荧光测量方法。

摘要

PROBLEM TO BE SOLVED: To provide a surface plasmon excitation fluorescence measurement apparatus and a surface plasmon excitation fluorescence measurement method, improving measurement accuracy by reducing the influence of the thickness of a conductor film.;SOLUTION: A surface plasmon excitation fluorescence measurement includes: supplying a sample to a first principal surface of a gold film; fixing an antibody solid layer film to the first principal surface of the gold film; closely contacting a second principal surface of the gold film with a close-contact surface of a prism; fluorescence-labelling an object to be measured captured by the antibody solid layer film; measuring light quantity of surface plasmon excitation fluorescence emitted from the fluorescence-labelled object to be measured when the prism is irradiated with excitation light; measuring light quantity of transmitted light passing through the gold film when the prism is irradiated with film thickness measuring light; and correcting a measurement value of the light quantity of the surface plasmon excitation fluorescence by using a measurement value of the light quantity of transmitted light. In the method, an incident angle θ1 of the excitation light to the close-contact surface is set to a resonance angle θr, and an incident angle θ2 of the film thickness measuring light to the close-contact surface is set to an angle smaller than a critical angle θc.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种表面等离子体激元荧光测量设备和表面等离子体激元荧光测量方法,通过减小导体膜厚度的影响来提高测量精度。解决方案:表面等离子体激元荧光测量包括:样品至金膜的第一主表面;将抗体固体层膜固定在金膜的第一主面上。金膜的第二主表面与棱镜的紧密接触表面紧密接触;抗体固体层膜捕获的荧光标记的待测物;当用激发光照射棱镜时,测量从要测量的荧光标记物体发射的表面等离子体激元激发荧光的光量;当用膜厚测量光照射棱镜时,测量穿过金膜的透射光的光量;通过使用透射光的光量的测量值来校正表面等离子体激元激发荧光的光量的测量值。在该方法中,激发光相对于紧密接触面的入射角θ1被设定为共振角θr,膜厚测定光相对于紧密接触面的入射角θ2被设定为小于临界角θc.;版权:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5640873B2

    专利类型

  • 公开/公告日2014-12-17

    原文格式PDF

  • 申请/专利权人 コニカミノルタ株式会社;

    申请/专利号JP20110085083

  • 发明设计人 米山 正利;栃本 茂昭;

    申请日2011-04-07

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 15:28:19

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